G01R 31/31709
Jitter measurements
Official title: {Jitter measurements; Jitter generators (measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/31901)}
G01R31/31709 (Jitter measurements) appears on 433 US grants and 457 published applications in this corpus.
Search patents in G01R- Granted patents
- 433
- Published applications
- 457
- Assignees
- 175
- Inventors
- 747
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 3 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 1 | 0 |
| 2001 | 3 | 1 |
| 2002 | 1 | 8 |
| 2003 | 9 | 7 |
| 2004 | 5 | 13 |
| 2005 | 5 | 36 |
| 2006 | 18 | 31 |
| 2007 | 30 | 38 |
| 2008 | 26 | 51 |
| 2009 | 33 | 42 |
| 2010 | 35 | 30 |
| 2011 | 36 | 18 |
| 2012 | 29 | 13 |
| 2013 | 17 | 11 |
| 2014 | 19 | 13 |
| 2015 | 15 | 8 |
| 2016 | 13 | 12 |
| 2017 | 10 | 12 |
| 2018 | 16 | 11 |
| 2019 | 13 | 18 |
| 2020 | 14 | 14 |
| 2021 | 11 | 14 |
| 2022 | 17 | 16 |
| 2023 | 19 | 14 |
| 2024 | 9 | 10 |
| 2025 | 6 | 10 |
| 2026 | 8 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Sub-sampled based instrument noise correction for jitter measurements8 Sep 2026US 12,730,146 B2Skyworks Solutions, Inc.
- Jitter applied detection for semiconductor secure element11 Aug 2026US 12,707,982 B2NXP B. V.
- Jitter measuring circuit, jitter analyzing apparatus including the same, and related methods of manufacturing semiconductor devices14 Jul 2026US 12,681,081 B2Samsung Electronics Co., Ltd.
- Test and/or measurement instrument for measuring an electrical signal16 Jun 2026US 12,656,396 B2Rohde & Schwarz GmbH & Co.KG
- Jitter injection generator for measuring phase noise and jitter transfer function7 Apr 2026US 12,596,148 B1NVIDIA Corporation
- Measurement application device, measurement application system, and method10 Sep 2026US 2026/0266902 A1Rohde & Schwarz GmbH & Co.KG
- Method and system for correlating and filtering high-speed signal (hss) jitter with power supply ripple16 Jul 2026US 2026/0202470 A1Tektronix, Inc.
- Multi-mode sensor, system-on-chip comprising the same and multi-mode sensing method thereof18 Jun 2026US 2026/0172012 A1Samsung Electronics Co., Ltd.
- Jitter injection generator for measuring phase noise and jitter transfer function9 Apr 2026US 2026/0098899 A1NVIDIA Corporation
- Apparatus and methods for jitter testing of clock signals5 Mar 2026US 2026/0063710 A1Skyworks Solutions, Inc.
Most cited
By later US patents
- Noise checking method and apparatus, and computer-readable recording medium in which noise checking program is stored194US 7,882,466 B2Fujitsu Limited · 2011
- Accurate alignment of clocks in mixed-signal tester92US 5,654,657 ASchlumberger Technologies, Inc. · 1997
- IC testing apparatus74US 5,894,226 AAndo Electric Co., Ltd. · 1999
- Capturing and evaluating high speed data streams61US 6,694,462 B1Teradyne, Inc. · 2004
- Jitter measurement using a statistically locked loop56US 5,481,563 ANetwork Systems Corporation · 1996