Jitter applied detection for semiconductor secure element
AssigneeNXP B.V.
InventorsKurt Ulrich Neugebauer, Nicolas Louis Bernard Nabor Hemmerle, Devesh Pratap Singh, Younes Benlakhouy
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Abstract
A method for jitter applied detection for a semiconductor secure element including generating a test waveform comprising a test pulse. The test waveform is modulated with an inductive loop coupled to a secure element and to an Electromagnetic (EM) signal to generate an observed waveform comprising an observed pulse, wherein the secure element comprises a flip-flop. A temporal change is measured between the test pulse and the observed pulse and the temporal change is compared to a reference to determine an Electromagnetic-Fault-Injection (EMFI) event.
Claims20
A method for jitter applied detection for a semiconductor secure element comprising:
- generating a test waveform comprising a test pulse;
- modulating the test waveform with an inductive loop coupled to a secure element and to an Electromagnetic (EM) signal to generate an observed waveform comprising an observed pulse, wherein the secure element comprises a flip-flop;
- and
- measuring a temporal change between the test pulse and the observed pulse and comparing the temporal change to a reference to determine an Electromagnetic-Fault-Injection (EMFI) event.
A method for jitter applied detection for a semiconductor secure element comprising:
- generating a test pulse;
- modulating the test pulse with an inductive loop coupled to a secure element to generate an observed pulse, wherein the inductive loop is configured to asymmetrically couple an Electromagnetic (EM) signal into a power network and a ground network to alter a timing of a signal of the secure element, the secure element comprising a sampling device;
- and
- measuring a temporal change between the test pulse and the observed pulse and comparing the temporal change to a reference to determine an Electromagnetic-Fault-Injection (EMFI) event.
An apparatus comprising:
- a pulse generator configured to generate a test waveform comprising a test pulse;
- an inductive loop coupled to a secure element and to an Electromagnetic (EM) signal, the secure element configured to generate an observed waveform comprising an observed pulse;
- a jitter measurement circuit configured to receive the test waveform and the observed waveform and to determine a jitter value from a difference between a test width of the test pulse and an observed width of the observed pulse;
- and
- a comparator circuit configured to compare the jitter value to a reference to determine an occurrence of an Electromagnetic-Fault-Injection (EMFI) event.
Dependencies are inferred from the claim text.