G01R 31/31719
Security aspects
Official title: {Security aspects, e.g. preventing unauthorised access during test}
G01R31/31719 (Security aspects) appears on 263 US grants and 272 published applications in this corpus.
Search patents in G01R- Granted patents
- 263
- Published applications
- 272
- Assignees
- 148
- Inventors
- 568
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 2 | 0 |
| 1992 | 1 | 0 |
| 1993 | 1 | 0 |
| 1994 | 4 | 0 |
| 1995 | 2 | 0 |
| 1996 | 4 | 0 |
| 1997 | 3 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 3 |
| 2002 | 4 | 7 |
| 2003 | 4 | 7 |
| 2004 | 5 | 11 |
| 2005 | 4 | 15 |
| 2006 | 12 | 7 |
| 2007 | 12 | 17 |
| 2008 | 9 | 11 |
| 2009 | 16 | 10 |
| 2010 | 14 | 12 |
| 2011 | 10 | 7 |
| 2012 | 11 | 8 |
| 2013 | 6 | 8 |
| 2014 | 5 | 13 |
| 2015 | 9 | 9 |
| 2016 | 14 | 14 |
| 2017 | 7 | 16 |
| 2018 | 10 | 6 |
| 2019 | 17 | 13 |
| 2020 | 11 | 13 |
| 2021 | 11 | 12 |
| 2022 | 7 | 9 |
| 2023 | 8 | 12 |
| 2024 | 14 | 11 |
| 2025 | 11 | 12 |
| 2026 | 6 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Secure scan testing of integrated circuits25 Aug 2026US 12,716,945 B2SK hynix Inc.
- Jitter applied detection for semiconductor secure element11 Aug 2026US 12,707,982 B2NXP B. V.
- Memory, memory system and method of controlling storage device16 Jun 2026US 12,656,394 B2Kioxia Corporation
- Supply chain security for chiplets2 Jun 2026US 12,644,925 B2Advanced Micro Devices, Inc.
- Test mode control circuit, semiconductor apparatus and system, and method thereof10 Feb 2026US 12,546,820 B2SK hynix Inc.
- Memory, memory system and method of controlling storage device24 Sep 2026US 2026/0287653 A1Kioxia Corporation
- Non-destructive fault detecting method and system using debug access ports25 Jun 2026US 2026/0177612 A1
- Wireless hardware trojan detection18 Jun 2026US 2026/0169065 A1
- Secure scan testing of integrated circuits28 May 2026US 2026/0147041 A1SK hynix Inc.
- High speed comparator based supply glitch detector21 May 2026US 2026/0140171 A1QUALCOMM Incorporated
Most cited
By later US patents
- Methods and apparatus for secure hardware configuration76US 5,530,753 AInternational Business Machines Corporation · 1996
- Self modifying access code for altering capabilities73US 5,365,587 AInternational Business Machines Corporation · 1994
- Memory system having two-level security system for enhanced protection against unauthorized access63US 5,293,610 AMotorola, Inc. · 1994
- Debug port disable mechanism54US 7,117,352 B1LSI Logic Corporation · 2006
- Device and method for testing integrated circuit dice in an integrated circuit module52US 6,605,956 B2Micron Technology, Inc. · 2003