G01R 31/31703
Comparison aspects
Official title: {Comparison aspects, e.g. signature analysis, comparators (concerning scan tests G01R31/318566; concerning testers G01R31/3193)}
G01R31/31703 (Comparison aspects) appears on 425 US grants and 464 published applications in this corpus.
Search patents in G01R- Granted patents
- 425
- Published applications
- 464
- Assignees
- 196
- Inventors
- 909
- Latest grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 3 | 0 |
| 2002 | 1 | 2 |
| 2003 | 0 | 5 |
| 2004 | 5 | 16 |
| 2005 | 3 | 9 |
| 2006 | 12 | 26 |
| 2007 | 15 | 26 |
| 2008 | 18 | 15 |
| 2009 | 18 | 13 |
| 2010 | 11 | 10 |
| 2011 | 18 | 4 |
| 2012 | 11 | 11 |
| 2013 | 7 | 7 |
| 2014 | 15 | 14 |
| 2015 | 11 | 16 |
| 2016 | 22 | 34 |
| 2017 | 20 | 37 |
| 2018 | 32 | 34 |
| 2019 | 41 | 30 |
| 2020 | 36 | 36 |
| 2021 | 31 | 21 |
| 2022 | 25 | 16 |
| 2023 | 19 | 27 |
| 2024 | 23 | 12 |
| 2025 | 14 | 25 |
| 2026 | 8 | 18 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Methods and apparatus to identify faults in processors12 May 2026US 12,625,179 B2Texas Instruments Incorporated
- Built-in self-test arrangement for a digital-to-analog converter3 Sep 2026US 2026/0259260 A1Infineon Technologies AG
- Integrated circuit including test circuit13 Aug 2026US 2026/0235666 A1Samsung Electronics Co., Ltd.
- Digital Glitch Sensor13 Aug 2026US 2026/0235672 A1Google Inc.
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Most cited
By later US patents
- Method and apparatus for evaluating and optimizing a signaling system146US 7,490,275 B2Rambus Inc. · 2009
- Through-core self-test with multiple loopbacks76US 7,346,819 B2Rambus Inc. · 2008
- Compressing test responses using a compactor50US 7,370,254 B22008
- Method and apparatus for evaluating and optimizing a signaling system45US 7,137,048 B2Rambus Inc. · 2006
- On-chip transistor degradation monitoring44US 7,205,854 B2Intel Corporation · 2007