Integrated circuit including test circuit

An integrated circuit comprising:

• a high-pass filter configured to receive a test signal and generate an internal test signal, at least one first reference signal, and at least one second reference signal;
• a first low-pass filter configured to receive the at least one first reference signal and generate a first reference voltage;
• a second low-pass filter configured to receive the at least one second reference signal and generate a second reference voltage;
• a first comparator configured to compare the first reference voltage to the internal test signal;
• and
• a second comparator configured to compare the second reference voltage to the internal test signal.

An integrated circuit operating in a plurality of test modes, the integrated circuit comprising:

• a voltage-dividing circuit comprising a plurality of resistors connected to each other in series, wherein the voltage-dividing circuit is configured to generate an internal test signal, a first reference signal, and a second reference signal;
• a first low-pass filter configured to receive the first reference signal and generate a first reference voltage;
• a second low-pass filter configured to receive the second reference signal and generate a second reference voltage;
• a first comparator configured to compare the first reference voltage to the internal test signal;
• and
• a second comparator configured to compare the second reference voltage to the internal test signal,
• wherein the voltage-dividing circuit is further configured to operate as a high-pass filter in a first test mode among the plurality of test modes.