Through-core self-test with multiple loopbacks

An integrated circuit device comprising:

• a test sequence generator to generate a test data sequence;
• a first transceiver coupled to receive the test data sequence from the test sequence generator and configurable in a loopback mode to transmit and receive the test data sequence;
• a second transceiver coupled to receive the test data sequence from the first transceiver and configurable in a loopback mode to transmit and receive the test data sequence;
• and
• a test sequence analyzer to determine whether the test data sequence received by the second transceiver matches the test data sequence generated by the test sequence generator.

A method of testing an integrated circuit device, the method comprising:

• generating a first sequence of test data values;
• transmitting a first test signal that corresponds to the first sequence of test data values;
• sampling the first test signal to generate a second sequence of test data values;
• transmitting a second test signal that corresponds to the second sequence of test data values;
• sampling the second test signal to generate a third sequence of test data values;
• and
• comparing the third sequence of test data values with the first sequence of test data values.

Computer-readable media having information embodied therein that constitutes a representation of an apparatus comprising:

• a test sequence generator configured to generate a test data sequence;
• a first transceiver coupled to receive the test data sequence from the test sequence generator and configurable in a loopback mode to transmit and receive the test data sequence;
• a second transceiver coupled to receive the test data sequence from the first transceiver and configurable in a loopback mode to transmit and receive the test data sequence;
• and
• a test sequence analyzer to determine whether the test data sequence received by the second transceiver matches the test data sequence generated by the test sequence generator.

An integrated circuit device comprising:

• means for generating a first sequence of test data values;
• means for transmitting a first test signal that corresponds to the first sequence of test data values;
• means for sampling the first test signal to generate a second sequence of test data values;
• means for transmitting a second test signal that corresponds to the second sequence of test data values;
• means for sampling the second test signal to generate a third sequence of test data values;
• and
• means for comparing the third sequence of test data values with the first sequence of test data values.