G01R 31/31721
Power aspects
Official title: {Power aspects, e.g. power supplies for test circuits, power saving during test (for scan test G01R31/318575)}
G01R31/31721 (Power aspects) appears on 483 US grants and 508 published applications in this corpus.
Search patents in G01R- Granted patents
- 483
- Published applications
- 508
- Assignees
- 200
- Inventors
- 921
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 4 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 2 | 0 |
| 2000 | 2 | 0 |
| 2001 | 3 | 2 |
| 2002 | 4 | 11 |
| 2003 | 8 | 15 |
| 2004 | 17 | 14 |
| 2005 | 11 | 20 |
| 2006 | 16 | 24 |
| 2007 | 16 | 38 |
| 2008 | 27 | 29 |
| 2009 | 26 | 34 |
| 2010 | 32 | 25 |
| 2011 | 30 | 24 |
| 2012 | 16 | 15 |
| 2013 | 18 | 25 |
| 2014 | 19 | 18 |
| 2015 | 25 | 29 |
| 2016 | 28 | 10 |
| 2017 | 19 | 21 |
| 2018 | 15 | 10 |
| 2019 | 10 | 12 |
| 2020 | 20 | 32 |
| 2021 | 24 | 14 |
| 2022 | 25 | 21 |
| 2023 | 21 | 16 |
| 2024 | 13 | 20 |
| 2025 | 21 | 14 |
| 2026 | 6 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor test apparatus and power supply method thereof1 Sep 2026US 12,724,067 B2Samsung Electronics Co., Ltd.
- Circuit screening system and circuit screening method16 Jun 2026US 12,656,395 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Probe card including power compensation circuit and test system including the same5 May 2026US 12,618,902 B2Samsung Electronics Co., Ltd.
- Determining a correlation between power disturbances and data errors in a test system31 Mar 2026US 12,591,007 B2Teradyne, Inc.
- In-system testing for autonomous systems and applications17 Mar 2026US 12,579,049 B2NVIDIA Corporation
- Circuit screening system and circuit screening method17 Sep 2026US 2026/0276705 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method and system for correlating and filtering high-speed signal (hss) jitter with power supply ripple16 Jul 2026US 2026/0202470 A1Tektronix, Inc.
- System on chip and debugging method for system on chip4 Jun 2026US 2026/0153561 A1Samsung Electronics Co., Ltd.
- On semiconductor die isolation circuitry to reduce high volume manufacturing test time28 May 2026US 2026/0147038 A1Intel Corporation
- High speed comparator based supply glitch detector21 May 2026US 2026/0140171 A1QUALCOMM Incorporated
Most cited
By later US patents
- Device for probe card power bus noise reduction96US 7,005,879 B1International Business Machines Corporation · 2006
- Apparatus for reducing power supply noise in an integrated circuit93US 6,339,338 B12002
- Apparatus for reducing power supply noise in an integrated circuit93US 6,456,103 B1FormFactor, Inc. · 2002
- Predictive, adaptive power supply for an integrated circuit under test86US 6,657,455 B2FormFactor, Inc. · 2003
- Generator/compactor scan circuit low power adapter with counter68US 6,763,488 B2Texas Instruments Incorporated · 2004