Probe card including power compensation circuit and test system including the same
AssigneeSamsung Electronics Co., Ltd.
InventorsSeongkwan Lee, Minho Kang, Jongpill Park, Cheolmin Park, Jaemoo Choi
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AssigneeSamsung Electronics Co., Ltd.
InventorsSeongkwan Lee, Minho Kang, Jongpill Park, Cheolmin Park, Jaemoo Choi
Estimating the term…
A probe card includes a plurality of power lines that are electrically connected to the plurality of DUTs, a plurality of ground lines that are electrically connected to the plurality of DUTs and to each other, and a plurality of power compensation circuits that are electrically connected to respective ones of the plurality of power lines and respective ones of the plurality of ground lines, where the plurality of power compensation circuits are configured to generate and provide a plurality of compensated power supply voltages to the respective ones of the plurality of power lines, and where the plurality of compensated power supply voltages are configured to inhibit a variation of a ground voltage of the respective ones of the plurality of ground lines.
A probe card for testing a plurality of devices under test (DUTs), the probe card comprising:
A test system comprising:
A probe card for testing a plurality of devices under test (DUTs), the probe card comprising:
Dependencies are inferred from the claim text.