Device for probe card power bus noise reduction
AssigneeInternational Business Machines Corporation
InventorRaphael Peter Robertazzi
Life of this patent
Estimating the term…
Abstract
Noise reduction for application of structural test patterns to a Device Under Test (DUT) is accomplished with a capacitor “booster” bypass network on the probe card in which the capacitors are charged to a much higher voltage Vboost than the DUT power supply voltage VDD. Charging the capacitors to a voltage N×VDD allows the buster network to store N times the charge of a conventionally configured capacitance network, and effectively provides N times the capacitance of the original network in the same physical space.
Claims5
A voltage drop suppression device for maintaining constant voltage on a power bus of a probe card used for semiconductor wafer testing, the device comprising:
- a bypass capacitor mounted on the probe card, wherein the bypass capacitor is charged to a voltage greater than a power supply voltage VDD of a device under test;
- and
- an active regulation circuit controlling the discharge of the bypass capacitor to supply current to the power bus for suppressing a voltage drop on the power bus generated by a current surge during testing of the device under test, said active regulation circuit comprises:
- (i) an operational amplifier connected to receive a reference voltage equal to the power supply voltage VDD, and connected to receive a voltage on the power bus;
- and
- (ii) a transistor connected to supply a current from the bypass capacitor to the power bus, wherein the transistor is controlled by the operational amplifier to supply more current as the voltage on the power bus decreases.
Dependencies are inferred from the claim text.