System on chip and debugging method for system on chip
AssigneeSamsung Electronics Co., Ltd.
InventorSung Hun KIM
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AssigneeSamsung Electronics Co., Ltd.
InventorSung Hun KIM
Estimating the term…
A system on chip (SoC) includes a plurality of blocks each including an input terminal and an output terminal and each including a plurality of synchronization circuits connected by a scan-chain, a test data in (TDI) line, a test data out (TDO) line connected to the output terminal, a test access port (TAP) controller to control an operation of the blocks based on a TDI signal, a TDO signal, a test clock (TCK) signal, a test reset (TRST) signal and a test mode select (TMS) signal, a power management unit to control power gating for the blocks, and a clock management unit to control a clock signal provided to the blocks. The TAP controller includes a first register that stores a first data for generating a first control signal controlling the power and clock management units, which control the operation of the blocks based on the first control signal.
A system on chip, comprising:
A system on chip, comprising:
A debugging method for a system on chip comprising a plurality of blocks each including an input terminal and an output terminal and each including a plurality of synchronization circuits connected by a scan-chain, the debugging method comprising:
Dependencies are inferred from the claim text.