Determining a correlation between power disturbances and data errors in a test system
AssigneeTeradyne, Inc.
InventorChristopher C. Jones
Life of this patent
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Abstract
An example system for testing a device under test (DUT) includes one or more processing devices configured to receive first data from the DUT over a communication channel, and to analyze the first data to identify an error associated with the communication channel; and a power supply controller configured to receive second data based on a power disturbance from the DUT, and to compare the first data and the second data to determine if there is a correlation between the power disturbance and the error.
Claims34
Automatic test equipment (ATE) for testing a device under test (DUT), the ATE comprising:
- a power supply configured to supply power to the DUT:
- one or more processing devices configured to receive first data from the DUT over a communication channel, and to analyze the first data to identify one or more bit errors in the first data, the first data representing operation of the DUT or an individual component of the DUT based on application of test data to the DUT;
- and
- a power supply controller configured to receive second data representing a power disturbance in the power supplied to the DUT, the power disturbance comprising a deviation in output of power from the power supply from a predefined norm, and the power disturbance not being intentionally inflicted;
- wherein the one or more processing devices are further configured to determine whether the DUT passed or failed testing based on the first data, to compare the first data and the second data to determine if there is a correlation between the power disturbance and the one or more bit errors, and to report to a user or computing system that the first data on which the testing is based contains bit errors that correlate to the power disturbance in the power supply.
A method for testing a device under test (DUT) using automatic test equipment (ATE), the method comprising:
- receiving first data from the DUT over a communication channel, the first data representing operation of the DUT or an individual component of the DUT based on application of test data to the DUT;
- determining whether the DUT passed or failed testing based on the first data;
- analyzing the first data to identify one or more bit errors in the first data;
- receiving second data representing a power disturbance in power supplied to the DUT by a power supply, the power disturbance comprising a deviation in output of power from the power supply from a predefined norm, and the power disturbance not being intentionally inflicted;
- comparing the first data and the second data to determine if there is a correlation between the power disturbance and the one or more bit errors;
- and
- reporting to a user or computing system that the first data on which the testing is based contains bit errors that correlate to the power disturbance in the power supply.
Dependencies are inferred from the claim text.