G01R 31/31725
Timing aspects
Official title: {Timing aspects, e.g. clock distribution, skew, propagation delay (for tester hardware G01R31/31937)}
G01R31/31725 (Timing aspects) appears on 1,157 US grants and 1,147 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,157
- Published applications
- 1,147
- Assignees
- 364
- Inventors
- 2,146
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 5 | 0 |
| 1994 | 4 | 0 |
| 1995 | 1 | 0 |
| 1996 | 4 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 4 | 0 |
| 2000 | 6 | 0 |
| 2001 | 8 | 2 |
| 2002 | 12 | 11 |
| 2003 | 17 | 17 |
| 2004 | 21 | 39 |
| 2005 | 26 | 43 |
| 2006 | 45 | 47 |
| 2007 | 53 | 71 |
| 2008 | 51 | 61 |
| 2009 | 46 | 51 |
| 2010 | 62 | 50 |
| 2011 | 49 | 45 |
| 2012 | 49 | 43 |
| 2013 | 54 | 46 |
| 2014 | 39 | 47 |
| 2015 | 46 | 48 |
| 2016 | 63 | 51 |
| 2017 | 49 | 49 |
| 2018 | 38 | 46 |
| 2019 | 63 | 60 |
| 2020 | 65 | 53 |
| 2021 | 53 | 40 |
| 2022 | 39 | 40 |
| 2023 | 46 | 55 |
| 2024 | 52 | 51 |
| 2025 | 41 | 49 |
| 2026 | 31 | 32 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- System and method for area-efficient monitoring of clock signals6 Oct 2026US 12,754,236 B2NXP B. V.
- Low hold multi-bit flip-flop6 Oct 2026US 12,756,381 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Systems and methods for measurement of a parameter of a DUT29 Sep 2026US 12,748,146 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Sub-sampled based instrument noise correction for jitter measurements8 Sep 2026US 12,730,146 B2Skyworks Solutions, Inc.
- Testing circuit for testing electrical devices and device under test8 Sep 2026US 12,730,147 B2Winbond Electronics Corp.
- Test and/or measurement system8 Oct 2026US 2026/0309826 A1
- Memory devices and memory systems outputting codes24 Sep 2026US 2026/0287654 A1SK hynix Inc.
- Circuit screening system and circuit screening method17 Sep 2026US 2026/0276705 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Concurrent testing device and method for integrated circuit27 Aug 2026US 2026/0251707 A1Macrotest Semiconductor Technology Co., Ltd
- Memory device configured for detecting a connection failure between signal paths27 Aug 2026US 2026/0251712 A1SK hynix Inc.
Most cited
By later US patents
- Apparatus for at-speed testing, in inter-domain mode, of a multi-clock-domain digital integrated circuit according to BIST or SCAN techniques226US 8,862,955 B2STMicroelectronics S,r.l. · 2014
- Semiconductor process and performance sensor185US 10,614,184 B2Atlazo, Inc. · 2020
- On-chip signal state duration measurement and adjustment109US 7,036,098 B2Sun Microsystems, Inc. · 2006
- Synchronization of hardware and software debuggers80US 6,826,717 B1Altera Corporation · 2004
- Fault tolerant operation of reconfigurable devices utilizing an adjustable system clock77US 6,874,108 B1Agere Systems Inc. · 2005