G01R 31/31726
Synchronization
Official title: {Synchronization, e.g. of test, clock or strobe signals; Signals in different clock domains; Generation of Vernier signals; Comparison and adjustment of the signals}
G01R31/31726 (Synchronization) appears on 242 US grants and 260 published applications in this corpus.
Search patents in G01R- Granted patents
- 242
- Published applications
- 260
- Assignees
- 134
- Inventors
- 521
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 2 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 1 | 5 |
| 2006 | 4 | 8 |
| 2007 | 10 | 23 |
| 2008 | 15 | 16 |
| 2009 | 12 | 18 |
| 2010 | 23 | 19 |
| 2011 | 13 | 14 |
| 2012 | 12 | 12 |
| 2013 | 13 | 12 |
| 2014 | 16 | 13 |
| 2015 | 13 | 8 |
| 2016 | 14 | 9 |
| 2017 | 7 | 4 |
| 2018 | 6 | 4 |
| 2019 | 10 | 14 |
| 2020 | 13 | 7 |
| 2021 | 4 | 9 |
| 2022 | 11 | 12 |
| 2023 | 8 | 13 |
| 2024 | 16 | 14 |
| 2025 | 10 | 9 |
| 2026 | 9 | 14 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for area-efficient monitoring of clock signals6 Oct 2026US 12,754,236 B2NXP B. V.
- Training method and test apparatus using the same1 Sep 2026US 12,724,068 B2Samsung Electronics Co., Ltd.
- Sensor circuit and method1 Sep 2026US 12,724,069 B2Bonsai Systems Inc.
- Signal generator circuit for a quantum computer control device11 Aug 2026US 12,704,870 B2Rohde & Schwarz GmbH & Co.KG
- Selecting an output as a system output responsive to an indication of an error9 Jun 2026US 12,650,465 B2SiFive, Inc.
- Memory devices and memory systems outputting codes24 Sep 2026US 2026/0287654 A1SK hynix Inc.
- Concurrent testing device and method for integrated circuit27 Aug 2026US 2026/0251707 A1Macrotest Semiconductor Technology Co., Ltd
- Techniques For Reduction Of Degradation In Channels Caused By Bias Temperature Instability20 Aug 2026US 2026/0246456 A1Altera Corporation
- Digital Glitch Sensor13 Aug 2026US 2026/0235672 A1Google Inc.
- Methods, systems, and computer readable media for processing time error data using unsupervised machine learning6 Aug 2026US 2026/0227438 A1Keysight Technologies, Inc.
Most cited
By later US patents
- Test apparatus and test method42US 9,262,376 B2Advantest Corporation · 2016
- Integrated circuit chip having a first delay circuit trimmed via a second delay circuit39US 7,187,599 B2Infineon Technologies North America Corp. · 2007
- Hardware description language code generation from a state diagram25US 7,503,027 B1The MathWorks, Inc. · 2009
- System and method for providing a clock and data recovery circuit with a self test capability23US 7,555,091 B1National Semiconductor Corporation · 2009
- Method and apparatus for calibrating internal pulses in an integrated circuit19US 7,944,229 B2International Business Machines Corporation · 2011