G11C 29/56
External testing equipment for static stores
Official title: External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
G11C29/56 (External testing equipment for static stores) appears on 2,032 US grants and 1,959 published applications in this corpus.
Search patents in G11C- Granted patents
- 2,032
- Published applications
- 1,959
- Assignees
- 463
- Inventors
- 3,855
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 2 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 5 | 0 |
| 1982 | 3 | 0 |
| 1983 | 6 | 0 |
| 1984 | 6 | 0 |
| 1985 | 3 | 0 |
| 1986 | 5 | 0 |
| 1987 | 4 | 0 |
| 1988 | 6 | 0 |
| 1989 | 7 | 0 |
| 1990 | 4 | 0 |
| 1991 | 8 | 0 |
| 1992 | 8 | 0 |
| 1993 | 6 | 0 |
| 1994 | 9 | 0 |
| 1995 | 7 | 0 |
| 1996 | 9 | 0 |
| 1997 | 13 | 0 |
| 1998 | 15 | 0 |
| 1999 | 38 | 0 |
| 2000 | 40 | 0 |
| 2001 | 34 | 20 |
| 2002 | 55 | 61 |
| 2003 | 48 | 74 |
| 2004 | 72 | 86 |
| 2005 | 63 | 106 |
| 2006 | 82 | 88 |
| 2007 | 81 | 103 |
| 2008 | 99 | 105 |
| 2009 | 82 | 92 |
| 2010 | 79 | 67 |
| 2011 | 78 | 67 |
| 2012 | 60 | 72 |
| 2013 | 56 | 59 |
| 2014 | 69 | 64 |
| 2015 | 63 | 70 |
| 2016 | 69 | 68 |
| 2017 | 69 | 65 |
| 2018 | 53 | 52 |
| 2019 | 69 | 81 |
| 2020 | 87 | 82 |
| 2021 | 94 | 88 |
| 2022 | 78 | 110 |
| 2023 | 79 | 85 |
| 2024 | 96 | 81 |
| 2025 | 71 | 60 |
| 2026 | 39 | 53 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G11C 2029/5602Interface to device under testIndexing code546
- G11C 29/56008Error analysis, representation of errors398
- G11C 29/56012Timing aspects, clock generation, synchronisation325
- G11C 29/56004Pattern generation279
- G11C 29/56016Apparatus features275
- G11C 2029/5606Error catch memoryIndexing code142
- G11C 2029/5604Display of error informationIndexing code87
Recent patents
- Semiconductor device, semiconductor device testing apparatus and semiconductor device testing method6 Oct 2026US 12,755,809 B2Renesas Electronics Corporation
- Motherboard for testing memory modules in the presence of failures6 Oct 2026US 12,755,810 B2Intelligent Memory Limited
- Cascade model for determining read level voltage offsets based on wordline group memory cells29 Sep 2026US 12,749,541 B2Micron Technology, Inc.
- Flash memory and testing method thereof15 Sep 2026US 12,738,340 B2Winbond Electronics Corp.
- Memory device including damage detection circuit and test system including the memory device11 Aug 2026US 12,706,171 B2Samsung Electronics Co., Ltd.
- Memory system configured for controlling a fuse array circuit1 Oct 2026US 2026/0301834 A1SK hynix Inc.
- Semiconductor memory device-directed error check and scrub17 Sep 2026US 2026/0277742 A1Micron Technology, Inc.
- Receiving device and data jitter suppression method thereof17 Sep 2026US 2026/0279483 A1Macronix International Co., Ltd.
- Testing adapters, testing systems, and testing methods for memory apparatus13 Aug 2026US 2026/0237449 A1Yangtze Memory Technologies Co., Ltd.
- Method of setting signal drive strength of storage13 Aug 2026US 2026/0237453 A1Atp Electronics Taiwan Inc.
Most cited
By later US patents
- Redundancy analysis for embedded memories with built-in self test and built-in self repair308US 6,067,262 ALSI Logic Corporation · 2000
- Monitoring health of non-volatile memory175US 7,861,122 B2Apple Inc. · 2010
- System and method for self-testing and repair of memory modules168US 6,754,117 B2Micron Technology, Inc. · 2004
- Data storage device tester135US 8,626,463 B2Western Digital Technologies, Inc. · 2014
- Synchronous memory test system118US 5,995,424 ATanisys Technology, Inc. · 1999