Semiconductor device, semiconductor device testing apparatus and semiconductor device testing method

A semiconductor device testing apparatus simultaneously testing a plurality of semiconductor devices, the semiconductor device testing apparatus comprising:

• a test board mounting the semiconductor devices;
• a test memory storing a test program;
• a test controller configured to execute the test program to generate test signals used for test of the semiconductor devices mounted on the test board;
• and
• a power supply circuit supplying power supply for the semiconductor devices,
• wherein the semiconductor devices mounted on the test board are divided into a first test group and a second test group, each of the semiconductor devices includes:
• a central processing unit (CPU);
• a memory;
• a test data input terminal receiving test data;
• a test group identification terminal receiving a test group identification signal;
• a test data input control circuit receiving the test group identification signal through the test group identification terminal and generating a memory write enable signal for allowing the test data to be written into the memory based on the test group identification signal;
• and
• a memory write control circuit generating test data write address and selecting the test data received through the test data input terminal based on the memory write enable signal to transfer the test data selected and the test data write address to the memory, and
• wherein the test group identification terminals of the semiconductor devices of the first test group are fixed to high level on the test board and the test group identification terminals of the semiconductor devices of the second test group are fixed to low level on the test board.