Data storage device tester
AssigneeWestern Digital Technologies, Inc.
InventorsCurtis E. Stevens, Lawrence J. Dalphy
Life of this patent
Estimating the term…
Abstract
A data storage device (DSD) tester is disclosed for testing a DSD. The DSD tester comprises control circuitry operable to receive production line data through an interface, wherein the production line data is related to the DSD. The control circuitry executes a DSD test on the DSD, and transmits failure data generated by the DSD test and the production line data to a failure information database.
Claims50
A data storage device (DSD) tester for testing a DSD, the DSD tester comprising control circuitry operable to:
- receive production line data from the DSD through an interface, wherein the production line data identifies at least part of the DSD;
- execute a DSD test on the DSD;
- and
- transmit failure data generated by the DSD test and the production line data to a failure information database.
A data storage device (DSD) tester for testing a DSD, the DSD tester comprising a screen and control circuitry operable to:
- receive production line data from the DSD through an interface, the production line data identifies at least part of the DSD;
- execute a DSD test on the DSD;
- correlate failure data generated by the DSD test with the production line data to generate correlated data;
- and
- display the correlated data on the screen.
A method of processing test data received from a data storage device (DSD) tester after testing a DSD, the method comprising:
- receiving production line data from the DSD, wherein the production line data identifies at least part of the DSD;
- receiving failure data generated by the DSD tester after testing the DSD;
- and
- correlating the failure data with the production line data to generate correlated data that identifies an error in the production line.
A method of testing a data storage device (DSD), the method comprising:
- receiving production line data from the DSD, wherein the production line data identifies at least part of the DSD;
- executing a DSD test on the DSD;
- and
- transmitting failure data generated by the DSD test and the production line data to a failure information database.
A method of testing a data storage device (DSD), the method comprising:
- receiving production line data from the DSD, wherein the production line data identifies at least part of the DSD;
- executing a DSD test on the DSD;
- correlate failure data generated by the DSD test with the production line data to generate correlated data;
- and
- displaying the correlated data on a screen.
A data storage device (DSD) tester for testing a DSD, the DSD tester comprising a plurality of bays and control circuitry operable to:
- detect when the DSD has been inserted into one of the bays;
- receive production line data through an interface, wherein the production line data is related to the DSD;
- execute a DSD test on the DSD;
- and
- transmit failure data generated by the DSD test and the production line data to a failure information database.
A data storage device (DSD) tester for testing a DSD, the DSD tester comprising a Universal Serial Bus (USB) key operable to plug into a USB port of a consumer device and control circuitry operable to:
- receive production line data through an interface, wherein the production line data is related to the DSD;
- execute a DSD test on the DSD;
- and
- transmit failure data generated by the DSD test and the production line data to a failure information database.
A method of testing a data storage device (DSD), the method comprising:
- detecting when the DSD has been inserted into a bay;
- receiving production line data related to the DSD;
- executing a DSD test on the DSD;
- and
- transmitting failure data generated by the DSD test and the production line data to a failure information database.
A method of testing a data storage device (DSD), the method comprising:
- plugging a Universal Serial Bus (USB) key into a USB port of a consumer device;
- receiving production line data related to the DSD;
- executing a DSD test on the DSD;
- and
- transmitting failure data generated by the DSD test and the production line data to a failure information database.
Dependencies are inferred from the claim text.