G11C 2029/5602
Interface to device under test
Official title: {Interface to device under test}
G11C2029/5602 (Interface to device under test) appears on 546 US grants and 630 published applications in this corpus.
Search patents in G11C- Granted patents
- 546
- Published applications
- 630
- Assignees
- 199
- Inventors
- 1,264
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 1 |
| 2002 | 2 | 3 |
| 2003 | 2 | 2 |
| 2004 | 8 | 14 |
| 2005 | 5 | 40 |
| 2006 | 18 | 39 |
| 2007 | 29 | 42 |
| 2008 | 37 | 43 |
| 2009 | 29 | 43 |
| 2010 | 28 | 19 |
| 2011 | 32 | 18 |
| 2012 | 26 | 20 |
| 2013 | 16 | 15 |
| 2014 | 20 | 21 |
| 2015 | 18 | 19 |
| 2016 | 16 | 13 |
| 2017 | 20 | 30 |
| 2018 | 17 | 16 |
| 2019 | 23 | 33 |
| 2020 | 32 | 37 |
| 2021 | 40 | 36 |
| 2022 | 28 | 29 |
| 2023 | 25 | 35 |
| 2024 | 29 | 25 |
| 2025 | 27 | 20 |
| 2026 | 15 | 17 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor device, semiconductor device testing apparatus and semiconductor device testing method6 Oct 2026US 12,755,809 B2Renesas Electronics Corporation
- Motherboard for testing memory modules in the presence of failures6 Oct 2026US 12,755,810 B2Intelligent Memory Limited
- Write latency testing systems and methods23 Jun 2026US 12,665,042 B2Advantest Corporation
- Memory device23 Jun 2026US 12,665,045 B2Etron Technology, Inc.
- Host-to-device interface circuitry testing26 May 2026US 12,640,221 B2Advanced Micro Devices, Inc.
- Testing adapters, testing systems, and testing methods for memory apparatus13 Aug 2026US 2026/0237449 A1Yangtze Memory Technologies Co., Ltd.
- Flexible systolic in-memory array testing device and control method thereof9 Jul 2026US 2026/0195227 A1Huazhong University of Science and Technology
- Memory system and a testing method2 Jul 2026US 2026/0188411 A1Winbond Electronics Corp.
- Semiconductor device, control method for semiconductor device and control program25 Jun 2026US 2026/0179714 A1Renesas Electronics Corporation
- Test circuit and semiconductor apparatus including the same11 Jun 2026US 2026/0162747 A1SK hynix Inc.
Most cited
By later US patents
- System and method for on-board diagnostics of memory modules110US 7,210,059 B2Micron Technology, Inc. · 2007
- In-line voltage contrast determination of tunnel oxide weakness in integrated circuit technology development81US 7,101,722 B1Advanced Micro Devices, Inc. · 2006
- Interface that allows testing and using memory modules in computer systems not designed for the modules61US 6,772,261 B1International Business Machines Corporation · 2004
- Method for testing semiconductor devices and an apparatus therefor52US 7,151,388 B2Kes Systems, Inc. · 2006
- Test device for wafer testing digital semiconductor circuits41US 7,180,313 B2Infineon Technologies AG · 2007