Semiconductor device, control method for semiconductor device and control program

A control method of a semiconductor device,

• wherein the semiconductor device comprises:
• a transmitter circuit, a receiving circuit configured to receive a differential signal and convert the differential signal into a received signal in which a logic value is represented by a pulse waveform;
• and
• a control circuit configured to perform predetermined processing based on the received signal,
• wherein, when an operation mode is a test mode, and
• wherein the control method comprises:
• generating test data by the control circuit;
• outputting, from the transmitter circuit, a differential signal corresponding to the test data;
• detecting, in the receiving circuit, an edge of the differential signal output from the transmitter circuit;
• generating, in the receiving circuit, a one-shot pulse having a predetermined width at a timing at which the edge is detected, and outputting the one-shot pulse as the received signal;
• and
• adjusting, in the receiving circuit, the predetermined width of the one-shot pulse based on a comparison result between the test data and the received signal corresponding to the test data.

A non-transitory computer-readable medium storing instructions that, when executed by one or more processors of a semiconductor device including a transmitter circuit, a receiving circuit configured to receive a differential signal and convert the differential signal into a received signal in which a logic value is represented by a pulse waveform, and a control circuit configured to perform predetermined processing based on the received signal, cause the semiconductor device to, when an operation mode is a test mode:

• generate test data by the control circuit;
• output, from the transmitter circuit, a differential signal corresponding to the test data;
• detect, in the receiving circuit, an edge of the differential signal output from the transmitter circuit;
• generate, in the receiving circuit, a one-shot pulse having a predetermined width at a timing at which the edge is detected, and output the one-shot pulse as the received signal;
• and
• adjust, in the receiving circuit, the predetermined width of the one-shot pulse based on a comparison result between the test data and the received signal corresponding to the test data.