G11C 29/00
Checking stores for correct operation
Official title: Checking stores for correct operation {; Subsequent repair}; Testing stores during standby or offline operation
G11C29/00 (Checking stores for correct operation) appears on 27,127 US grants and 23,846 published applications in this corpus.
Search patents in G11C- Granted patents
- 27,127
- Published applications
- 23,846
- Assignees
- 2,063
- Inventors
- 26,023
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 21 | 0 |
| 1977 | 23 | 0 |
| 1978 | 18 | 0 |
| 1979 | 14 | 0 |
| 1980 | 19 | 0 |
| 1981 | 19 | 0 |
| 1982 | 35 | 0 |
| 1983 | 34 | 0 |
| 1984 | 63 | 0 |
| 1985 | 46 | 0 |
| 1986 | 62 | 0 |
| 1987 | 79 | 0 |
| 1988 | 86 | 0 |
| 1989 | 97 | 0 |
| 1990 | 92 | 0 |
| 1991 | 101 | 0 |
| 1992 | 130 | 0 |
| 1993 | 181 | 0 |
| 1994 | 251 | 0 |
| 1995 | 297 | 0 |
| 1996 | 386 | 0 |
| 1997 | 364 | 0 |
| 1998 | 503 | 0 |
| 1999 | 577 | 0 |
| 2000 | 493 | 0 |
| 2001 | 522 | 219 |
| 2002 | 598 | 620 |
| 2003 | 612 | 682 |
| 2004 | 645 | 835 |
| 2005 | 626 | 861 |
| 2006 | 744 | 817 |
| 2007 | 747 | 871 |
| 2008 | 774 | 919 |
| 2009 | 701 | 877 |
| 2010 | 810 | 730 |
| 2011 | 777 | 670 |
| 2012 | 704 | 733 |
| 2013 | 789 | 775 |
| 2014 | 934 | 1020 |
| 2015 | 1038 | 1144 |
| 2016 | 1180 | 1099 |
| 2017 | 1167 | 1058 |
| 2018 | 1024 | 1037 |
| 2019 | 1197 | 1273 |
| 2020 | 1328 | 1210 |
| 2021 | 1203 | 1154 |
| 2022 | 1163 | 1345 |
| 2023 | 1203 | 1184 |
| 2024 | 1168 | 1114 |
| 2025 | 954 | 862 |
| 2026 | 528 | 737 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G11C 29/04Detection or location of defective memory elements17,865
- G11C 29/02Detection or location of defective auxiliary circuits8,051
- G11C 29/70Masking faults in memories by using spares or by reconfiguring7,421
- G11C 29/52Protection of memory contents4,397
- G11C 29/56External testing equipment for static stores2,032
- G11C 29/006At wafer scale level, i.e. wafer scale integration [wsi]657
- G11C 29/54Arrangements for designing test circuits168
- G11C 29/003In serial memories81
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- Reading and Writing Device Under Test Register Values8 Oct 2026US 2026/0311789 A1National Instruments Corporation
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Most cited
By later US patents
- Three dimensional structure memory1,560US 5,915,167 AElm Technology Corporation · 1999
- Scheme for information dispersal and reconstruction1,530US 5,485,474 APresident and Fellows of Harvard College · 1996
- System and a method for defining transforms of memory device addresses1,397US 6,366,995 B1Acuid Corporation Limited · 2002
- Multi-state memory1,008US 6,222,762 B1SanDisk Corporation · 2001
- High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates827US 5,867,429 ASanDisk Corporation · 1999