G11C 29/02
Detection or location of defective auxiliary circuits
Official title: Detection or location of defective auxiliary circuits, e.g. defective refresh counters
G11C29/02 (Detection or location of defective auxiliary circuits) appears on 8,051 US grants and 7,901 published applications in this corpus.
Search patents in G11C- Granted patents
- 8,051
- Published applications
- 7,901
- Assignees
- 769
- Inventors
- 9,720
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 5 | 0 |
| 1977 | 2 | 0 |
| 1978 | 0 | 0 |
| 1979 | 1 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 5 | 0 |
| 1985 | 5 | 0 |
| 1986 | 5 | 0 |
| 1987 | 11 | 0 |
| 1988 | 7 | 0 |
| 1989 | 13 | 0 |
| 1990 | 8 | 0 |
| 1991 | 6 | 0 |
| 1992 | 5 | 0 |
| 1993 | 16 | 0 |
| 1994 | 27 | 0 |
| 1995 | 37 | 0 |
| 1996 | 26 | 0 |
| 1997 | 44 | 0 |
| 1998 | 59 | 0 |
| 1999 | 73 | 0 |
| 2000 | 73 | 0 |
| 2001 | 66 | 28 |
| 2002 | 98 | 92 |
| 2003 | 105 | 140 |
| 2004 | 124 | 211 |
| 2005 | 173 | 211 |
| 2006 | 188 | 239 |
| 2007 | 204 | 257 |
| 2008 | 225 | 249 |
| 2009 | 210 | 248 |
| 2010 | 244 | 201 |
| 2011 | 218 | 199 |
| 2012 | 175 | 200 |
| 2013 | 245 | 219 |
| 2014 | 268 | 315 |
| 2015 | 334 | 364 |
| 2016 | 393 | 345 |
| 2017 | 384 | 333 |
| 2018 | 360 | 360 |
| 2019 | 441 | 445 |
| 2020 | 490 | 455 |
| 2021 | 474 | 450 |
| 2022 | 495 | 663 |
| 2023 | 554 | 577 |
| 2024 | 521 | 503 |
| 2025 | 435 | 335 |
| 2026 | 195 | 262 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G11C 29/028With adaption or trimming of parameters5,422
- G11C 29/021In voltage or current generators2,418
- G11C 29/023In clock generator or timing circuitry1,588
- G11C 29/022In i/o circuitry1,441
- G11C 29/025In signal lines1,167
- G11C 29/026In sense amplifiers461
- G11C 29/027In fuses377
- G11C 29/024In decoders139
Recent patents
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Most cited
By later US patents
- High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates827US 5,867,429 ASanDisk Corporation · 1999
- Soft errors handling in EEPROM devices538US 5,657,332 ASanDisk Corporation · 1997
- On-chip test circuit for evaluating an on-chip signal using an external test signal444US 6,163,862 AInternational Business Machines Corporation · 2000
- Soft errors handling in EEPROM devices433US 5,532,962 ASanDisk Corporation · 1996
- Memory system including a point-to-point linked memory subsystem431US 6,502,161 B1Rambus Inc. · 2002