G11C 29/025
In signal lines
Official title: {in signal lines}
G11C29/025 (In signal lines) appears on 1,167 US grants and 1,121 published applications in this corpus.
Search patents in G11C- Granted patents
- 1,167
- Published applications
- 1,121
- Assignees
- 202
- Inventors
- 1,984
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 2 | 0 |
| 1988 | 3 | 0 |
| 1989 | 6 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
| 1993 | 5 | 0 |
| 1994 | 7 | 0 |
| 1995 | 6 | 0 |
| 1996 | 7 | 0 |
| 1997 | 9 | 0 |
| 1998 | 11 | 0 |
| 1999 | 21 | 0 |
| 2000 | 19 | 0 |
| 2001 | 12 | 8 |
| 2002 | 15 | 4 |
| 2003 | 11 | 20 |
| 2004 | 19 | 46 |
| 2005 | 31 | 27 |
| 2006 | 26 | 32 |
| 2007 | 29 | 33 |
| 2008 | 32 | 34 |
| 2009 | 41 | 49 |
| 2010 | 27 | 26 |
| 2011 | 33 | 40 |
| 2012 | 27 | 43 |
| 2013 | 43 | 31 |
| 2014 | 41 | 42 |
| 2015 | 52 | 56 |
| 2016 | 59 | 66 |
| 2017 | 72 | 61 |
| 2018 | 68 | 58 |
| 2019 | 56 | 58 |
| 2020 | 59 | 54 |
| 2021 | 61 | 66 |
| 2022 | 63 | 71 |
| 2023 | 68 | 63 |
| 2024 | 55 | 58 |
| 2025 | 51 | 39 |
| 2026 | 16 | 36 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor system and wiring defect detecting method29 Sep 2026US 12,749,549 B2Kioxia Corporation
- Storage apparatus including word line grouping device and operating method thereof25 Aug 2026US 12,718,894 B2SK hynix Inc.
- Flash memory architecture implementing interconnection redundancy18 Aug 2026US 12,711,028 B2
- Defect detection during erase operations18 Aug 2026US 12,712,041 B2Micron Technology, Inc.
- Fault diagnostics16 Jun 2026US 12,657,365 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor device for performing test operation of through-silicon vias13 Aug 2026US 2026/0235677 A1Samsung Electronics Co., Ltd.
- Memory system for detecting fault in signal transmission path23 Jul 2026US 2026/0212944 A1SK hynix Inc.
- Electronic apparatus9 Jul 2026US 2026/0196283 A1KYOCERA Document Solutions Inc.
- Memory test algorithms for 3d integrated circuits (ic)2 Jul 2026US 2026/0188404 A1Intel Corporation
- Memory systems for reducing signal line loads and occupied areas25 Jun 2026US 2026/0178218 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Scannable sense amplifier circuit421US 5,915,084 AAdvanced Micro Devices, Inc. · 1999
- Latent defect handling in EEPROM devices238US 5,428,621 ASunDisk Corporation · 1995
- Flash EEPROM array with high endurance157US 5,335,198 AAdvanced Micro Devices, Inc. · 1994
- Method of repairing overerased cells in a flash memory149US 5,237,535 AIntel Corporation · 1993
- Method and apparatus for evaluating and optimizing a signaling system146US 7,490,275 B2Rambus Inc. · 2009