Semiconductor system and wiring defect detecting method
AssigneeKioxia Corporation
InventorKouichirou Inoue
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AssigneeKioxia Corporation
InventorKouichirou Inoue
Estimating the term…
A semiconductor system includes a first semiconductor chip, a second semiconductor chip stacked above the first semiconductor chip, a controller configured to control the first and second semiconductor chips, a first wiring connected between the controller and each of the first and second semiconductor chips and by which a first signal is to be transmitted from the controller to each of the first and second semiconductor chips, a second wiring connected between the controller and the first semiconductor chip and by which a current of the first signal flowing through the first wiring to the first semiconductor chip is to be returned to the controller, and a third wiring connected between the controller and the second semiconductor chip and by which a current of the first signal flowing through the first wiring to the second semiconductor chip is to be returned to the controller.
A semiconductor system comprising:
A semiconductor system comprising:
A wiring defect detecting method comprising:
Dependencies are inferred from the claim text.