G11C 29/026
In sense amplifiers
Official title: {in sense amplifiers}
G11C29/026 (In sense amplifiers) appears on 461 US grants and 408 published applications in this corpus.
Search patents in G11C- Granted patents
- 461
- Published applications
- 408
- Assignees
- 129
- Inventors
- 665
- Latest grant
- 21 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 4 | 0 |
| 1998 | 4 | 0 |
| 1999 | 20 | 0 |
| 2000 | 15 | 0 |
| 2001 | 12 | 8 |
| 2002 | 11 | 7 |
| 2003 | 9 | 13 |
| 2004 | 13 | 22 |
| 2005 | 16 | 19 |
| 2006 | 21 | 18 |
| 2007 | 18 | 18 |
| 2008 | 15 | 33 |
| 2009 | 20 | 14 |
| 2010 | 27 | 15 |
| 2011 | 11 | 16 |
| 2012 | 16 | 10 |
| 2013 | 17 | 19 |
| 2014 | 15 | 16 |
| 2015 | 19 | 19 |
| 2016 | 27 | 16 |
| 2017 | 21 | 15 |
| 2018 | 17 | 10 |
| 2019 | 9 | 12 |
| 2020 | 10 | 8 |
| 2021 | 10 | 11 |
| 2022 | 14 | 28 |
| 2023 | 20 | 21 |
| 2024 | 20 | 20 |
| 2025 | 16 | 11 |
| 2026 | 9 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor device that detects connection defects between word lines and bit lines and test method for the same21 Jul 2026US 12,688,901 B2SK hynix Inc.
- Bitline sense amplifiers and semiconductor devices including the same7 Jul 2026US 12,676,170 B2Samsung Electronics Co., Ltd.
- Program verify compensation by sensing time modulation in a memory device with a defective deck26 May 2026US 12,640,213 B2Micron Technology, Inc.
- Multi-level cell data encoding28 Apr 2026US 12,614,600 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Encoder14 Apr 2026US 12,603,662 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Capacitor leak detect and retire27 Aug 2026US 2026/0251693 A1Micron Technology, Inc.
- Multi-level cell data encoding20 Aug 2026US 2026/0245645 A1
- Method of detecting sense margin of memory read operation and related sense margin detecting circuit6 Aug 2026US 2026/0229259 A1United Microelectronics Corp.
- Encoder30 Jul 2026US 2026/0221985 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Bit line direct charge2 Jul 2026US 2026/0188380 A1
Most cited
By later US patents
- Scannable sense amplifier circuit421US 5,915,084 AAdvanced Micro Devices, Inc. · 1999
- Method circuit and system for read error detection in a non-volatile memory array317US 6,992,932 B2Saifun Semiconductors Ltd. · 2006
- Semiconductor memory device capable of generating internal data read timing precisely212US 6,760,269 B2Renesas Technology Corp. · 2004
- Non-volatile memory and method with improved sensing147US 7,023,736 B2SanDisk Corporation · 2006
- Memory device138US 6,873,543 B2Hewlett-Packard Development Company, L. P. · 2005