Method circuit and system for read error detection in a non-volatile memory array
AssigneeSaifun Semiconductors Ltd.
InventorGuy Cohen
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AssigneeSaifun Semiconductors Ltd.
InventorGuy Cohen
Estimating the term…
The present invention is a method, circuit and system for determining a reference voltage to be used in reading cells programmed to a given program state. Some embodiments of the present invention relate to a system, method and circuit for establishing a set of operating reference cells to be used in operating (e.g. reading) cells in a NVM block or array. As part of the present invention, at least a subset of cells of the NVM block or array may be read and the number of cells found at a given state associated with the array may be compared to one or more check sum values obtained during programming of the at least a subset of cells. A Read Verify threshold reference voltage associated with the given program state or associated with an adjacent state may be adjusted based on the result of the comparison.
A method of detecting read errors in a set of NVM cells, said method comprising:
A method of adjusting one or more read verify reference levels of a set of cells comprising:
Dependencies are inferred from the claim text.