Method of detecting sense margin of memory read operation and related sense margin detecting circuit
AssigneeUnited Microelectronics Corp.
InventorsChin-Hsun Yeh, Min-Chia Wang
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AssigneeUnited Microelectronics Corp.
InventorsChin-Hsun Yeh, Min-Chia Wang
Estimating the term…
During a first phase, a bit line voltage is transmitted to a first input end of a sense amplifier and a reference voltage is transmitted to a second input end of the sense amplifier, so that the sense amplifier outputs data based on a first voltage difference between its first and second input ends for providing a first data signal. During a second phase, the reference voltage is transmitted to the first input end of the sense amplifier and the bit line voltage is transmitted to the second input end of the sense amplifier, so that the sense amplifier outputs data based on a second voltage difference between its first and second input ends for providing a second data signal. During a third phase, a sense margin detecting signal is provided based on the first data signal and the second data signal.
A method of detecting a sense margin of memory read operation, comprising:
A sense margin detecting circuit of memory read operation, comprising:
Dependencies are inferred from the claim text.