G11C 29/027
In fuses
Official title: {in fuses}
G11C29/027 (In fuses) appears on 377 US grants and 349 published applications in this corpus.
Search patents in G11C- Granted patents
- 377
- Published applications
- 349
- Assignees
- 111
- Inventors
- 667
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 5 | 0 |
| 1996 | 4 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 5 | 1 |
| 2002 | 2 | 4 |
| 2003 | 9 | 15 |
| 2004 | 9 | 16 |
| 2005 | 16 | 11 |
| 2006 | 20 | 21 |
| 2007 | 12 | 20 |
| 2008 | 13 | 18 |
| 2009 | 18 | 18 |
| 2010 | 20 | 12 |
| 2011 | 13 | 6 |
| 2012 | 10 | 12 |
| 2013 | 16 | 20 |
| 2014 | 20 | 17 |
| 2015 | 14 | 19 |
| 2016 | 16 | 11 |
| 2017 | 14 | 17 |
| 2018 | 10 | 10 |
| 2019 | 17 | 10 |
| 2020 | 16 | 14 |
| 2021 | 18 | 17 |
| 2022 | 13 | 13 |
| 2023 | 24 | 21 |
| 2024 | 14 | 16 |
| 2025 | 11 | 3 |
| 2026 | 5 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Electrical fuse bit cell in integrated circuit having backside conducting lines16 Jun 2026US 12,660,610 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Apparatuses systems and methods for identification encoding for memory devices26 May 2026US 12,640,217 B2Micron Technology, Inc.
- Memory with electrically programmable fuses and related tester21 Apr 2026US 12,608,271 B2Etron Technology, Inc.
- Memory device7 Apr 2026US 12,597,478 B2Rohm Co., Ltd.
- Memory with electrically programmable fuse blown result correcting function and operational method thereof6 Jan 2026US 12,517,783 B2Etron Technology, Inc.
- Memory system configured for controlling a fuse array circuit1 Oct 2026US 2026/0301834 A1SK hynix Inc.
- Repair Sharing In Serial Repair Interfaces25 Jun 2026US 2026/0179710 A1Google Inc.
- Test circuit and memory device including thereof, and operation method of memory device18 Jun 2026US 2026/0171185 A1Samsung Electronics Co., Ltd.
- Semiconductor memory device28 May 2026US 2026/0148797 A1SK hynix Inc.
- Memory device with built-in self-test7 May 2026US 2026/0128114 A1PUFsecurity Corporation
Most cited
By later US patents
- Method of determining an electrical characteristic of an antifuse and apparatus therefor71US 5,293,133 AQuickLogic Corporation · 1994
- Apparatus and method for determining the resistance of antifuses in an array63US 5,526,312 AActel Corporation · 1996
- Apparatus and method determining the resistance of antifuses in an array62US 5,469,396 AActel Corporation · 1995
- OTP antifuse cell and cell array62US 7,102,951 B2Intel Corporation · 2006
- Apparatus and method for determining the resistance of antifuses in an array57US 5,572,476 AActel Corporation · 1996