Repair Sharing In Serial Repair Interfaces

A device comprising:

• a plurality of memory devices each having a serial self-repair interface, one of the memory devices acting as a main memory and all other memory devices acting as shadow memories;
• and
• a sharing structure comprising logic circuitry for inputting a same set of self-repair data to each of the plurality of memory devices and receiving self-repair outputs from the plurality of memory devices,
• wherein the sharing structure comprises fault identification logic configured to detect mismatches between the self-repair outputs of the plurality of memory devices,
• the fault identification logic comprises a plurality of XOR gates configured to compare self-repair outputs from respective pairs of the plurality of memory devices, and
• the fault identification logic comprises an N-input OR gate having a number of inputs equal to the number of XOR gates.

A method performed by a device comprising a plurality of memory devices each having a serial self-repair interface, one of the memory devices acting as a main memory and all other memory devices acting as shadow memories, the method comprising:

• inputting, by a sharing structure, a same set of self-repair data to each of the plurality of memory devices;
• receiving, at the sharing structure, self-repair outputs from the plurality of memory devices;
• and
• detecting, by fault identification logic of the sharing structure, mismatches between the self-repair outputs of the plurality of memory devices,
• the fault identification logic comprises using a plurality of XOR gates configured to compare self-repair outputs from respective pairs of the plurality of memory devices, and
• the fault identification logic comprises using an N-input OR gate having a number of inputs equal to the number of XOR gates.

One or more non-transitory computer storage media encoded with computer program instructions that when executed by one or more computers cause the one or more computers to:

• input, by a sharing structure, a same set of self-repair data to each of the plurality of memory devices;
• receive, at the sharing structure, self-repair outputs from the plurality of memory devices;
• and
• detect, by fault identification logic of the sharing structure, mismatches between the self-repair outputs of the plurality of memory devices,
• the fault identification logic comprises using a plurality of XOR gates configured to compare self-repair outputs from respective pairs of the plurality of memory devices, and
• the fault identification logic comprises using an N-input OR gate having a number of inputs equal to the number of XOR gates.