G11C 29/023
In clock generator or timing circuitry
Official title: {in clock generator or timing circuitry}
G11C29/023 (In clock generator or timing circuitry) appears on 1,588 US grants and 1,643 published applications in this corpus.
Search patents in G11C- Granted patents
- 1,588
- Published applications
- 1,643
- Assignees
- 248
- Inventors
- 2,301
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 6 | 5 |
| 2003 | 3 | 5 |
| 2004 | 5 | 9 |
| 2005 | 6 | 14 |
| 2006 | 12 | 38 |
| 2007 | 24 | 39 |
| 2008 | 33 | 48 |
| 2009 | 36 | 41 |
| 2010 | 54 | 55 |
| 2011 | 40 | 48 |
| 2012 | 42 | 46 |
| 2013 | 62 | 62 |
| 2014 | 77 | 93 |
| 2015 | 89 | 93 |
| 2016 | 96 | 77 |
| 2017 | 103 | 72 |
| 2018 | 87 | 95 |
| 2019 | 111 | 118 |
| 2020 | 125 | 91 |
| 2021 | 111 | 92 |
| 2022 | 92 | 154 |
| 2023 | 118 | 138 |
| 2024 | 125 | 101 |
| 2025 | 85 | 66 |
| 2026 | 45 | 43 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Non-volatile memory switch with host isolation6 Oct 2026US 12,754,788 B2Marvell Asia Pte Ltd
- Memory device that includes a duty correction circuit, memory controller that includes a duty sensing circuit, and storage device that includes a memory device6 Oct 2026US 12,755,768 B2Samsung Electronics Co., Ltd.
- Signal retiming within memory systems22 Sep 2026US 12,744,065 B2Micron Technology, Inc.
- Training procedure change determination to detect attack25 Aug 2026US 12,717,901 B2Micron Technology, Inc.
- Computing system performing duty cycle adjuster training and duty cycle adjuster training method thereof25 Aug 2026US 12,718,864 B2Samsung Electronics Co., Ltd.
- Memory device, memory device including memory die stack, and wafer-level testing method for semiconductor chip1 Oct 2026US 2026/0301833 A1Samsung Electronics Co., Ltd.
- Reception apparatus, memory controller, and memory system24 Sep 2026US 2026/0290481 A1Kioxia Corporation
- Differential strobe fault identification20 Aug 2026US 2026/0245650 A1Micron Technology, Inc.
- Clock duty cycle monitoring and adjustment13 Aug 2026US 2026/0238201 A1QUALCOMM Incorporated
- Minimum memory clock estimation procedures30 Jul 2026US 2026/0221174 A1Micron Technology, Inc.
Most cited
By later US patents
- Method of optimizing solid state drive soft retry voltages342US 9,025,393 B2Seagate Technology LLC · 2015
- Semiconductor memory device capable of generating internal data read timing precisely212US 6,760,269 B2Renesas Technology Corp. · 2004
- Method and apparatus for coordinating memory operations among diversely-located memory components165US 6,675,272 B2Rambus Inc. · 2004
- Memory system and method using stacked memory device dice, and system using the memory system103US 7,855,931 B2Micron Technology, Inc. · 2010
- Method of timing calibration using slower data rate pattern98US 6,735,709 B1Micron Technology, Inc. · 2004