Differential strobe fault identification
AssigneeMicron Technology, Inc.
InventorsScott E. Schaefer, Paul A. Laberge
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AssigneeMicron Technology, Inc.
InventorsScott E. Schaefer, Paul A. Laberge
Estimating the term…
Methods, systems, and devices for differential strobe fault indication are described. A memory device may be configured to indicate a fault using a read strobe signal. The read strobe signal may be a read data strobe (RDQS) signal, such as a true RDQS (RDQS_t) signal or a complement RDQS (RDQS_c) signal. In some examples, the memory device may indicate the fault based on a characteristic of the read strobe signal, such as a pattern of the read strobe signal, a voltage level of the read strobe signal, a difference between a first read strobe signal and a second read strobe signal, or any combination thereof. In some examples, a host device may identify a fault type (e.g., recoverable or unrecoverable) based on a fault signature associated with a given characteristic of the read strobe signal. The host device may perform recovery operations based on the fault type identified.
A method, at a host device, comprising:
A method, at a memory device, comprising:
An apparatus, comprising:
Dependencies are inferred from the claim text.