Method of optimizing solid state drive soft retry voltages
AssigneeSeagate Technology LLC
InventorsYunxiang Wu, Zhengang Chen, YingQuan Wu, Ning Chen
Life of this patent
Estimating the term…
Loading patent…
AssigneeSeagate Technology LLC
InventorsYunxiang Wu, Zhengang Chen, YingQuan Wu, Ning Chen
Estimating the term…
A method of optimizing solid state drive (SSD) soft retry voltages comprises limiting a number of voltage reads and properly spacing and determining the reference voltage at which each voltage is read based on desired Bit Error Rate (BER) and channel throughput. The method determines each reference voltage for a number of soft retry voltage reads based on a hard decision read. The spacing between each read reference voltage is constant since each SSD type requires a number of reads for an accurate presentation of soft retry voltages. The voltage distance between each successive read is limited to a multiple of the constant spacing while the multiple is based on success or failure of the first read. The method determines a limited number of reads, the constant spacing between reads, and a desired reference voltage for each read, thereby increasing valuable throughput of the channel and decreasing BER.
A method for optimizing solid state drive soft retry voltages, comprising:
A non-transitory computer readable medium having computer readable program code embodied therein for optimizing solid state drive soft retry voltages, the computer readable program code comprising instructions which, when executed by a computer device or processor, perform and direct the steps of:
Dependencies are inferred from the claim text.