G11C 29/003
In serial memories
Official title: {in serial memories}
G11C29/003 (In serial memories) appears on 81 US grants and 39 published applications in this corpus.
Search patents in G11C- Granted patents
- 81
- Published applications
- 39
- Assignees
- 48
- Inventors
- 164
- Latest grant
- 22 Apr 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 0 | 0 |
| 1982 | 3 | 0 |
| 1983 | 2 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 3 | 0 |
| 1994 | 1 | 0 |
| 1995 | 3 | 0 |
| 1996 | 4 | 0 |
| 1997 | 3 | 0 |
| 1998 | 3 | 0 |
| 1999 | 2 | 0 |
| 2000 | 4 | 0 |
| 2001 | 2 | 0 |
| 2002 | 2 | 2 |
| 2003 | 4 | 2 |
| 2004 | 1 | 2 |
| 2005 | 0 | 5 |
| 2006 | 2 | 1 |
| 2007 | 3 | 4 |
| 2008 | 3 | 4 |
| 2009 | 5 | 4 |
| 2010 | 2 | 1 |
| 2011 | 7 | 3 |
| 2012 | 1 | 1 |
| 2013 | 2 | 3 |
| 2014 | 3 | 2 |
| 2015 | 0 | 1 |
| 2016 | 1 | 1 |
| 2017 | 1 | 0 |
| 2018 | 1 | 0 |
| 2019 | 1 | 1 |
| 2020 | 1 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 1 |
| 2025 | 1 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Component die validation built-in self-test (VBIST) engine22 Apr 2025US 12,282,064 B2Ampere Computing LLC
- Test interface board having a transmission line to merge signals, test method using the same, and test system including the same22 Sep 2020US 10,782,349 B2Samsung Electronics Co., Ltd.
- Timing optimizations in circuit designs using opposite clock edge triggered flip-flops17 Sep 2019US 10,416,232 B1Xilinx, Inc.
- Methods and apparatuses for master-slave detection30 Jan 2018US 9,881,658 B2Micron Technology, Inc.
- Information processing system, information compression device, information decompression device, information processing method, and program24 Jan 2017US 9,553,604 B2NEC Corporation
- Component die validation built-in self-test (vbist) engine17 Jul 2025US 2025/0231236 A1Ampere Computing LLC
- Component die validation built-in self-test (vbist) engine4 Jan 2024US 2024/0003974 A1Ampere Computing LLC
- Test interface board having a transmission line to merge signals, test method using the same, and test system including the same3 Jan 2019US 2019/0004113 A1Samsung Electronics Co., Ltd.
- Embedded resilient buffer11 Aug 2016US 2016/0232051 A1
- Methods and apparatuses for master-slave detection26 Feb 2015US 2015/0058656 A1Micron Technology, Inc.
Most cited
By later US patents
- Bidirectional first-in-first-out memory device with transparent and user-testable capabilities83US 5,255,239 ACypress Semiconductor Corporation · 1993
- Methods of testing integrated circuits to include data traversal path identification information and related status information in test data streams53US 6,173,425 B2Integrated Device Technology, Inc. · 2001
- Multiport memory with test signal generating circuit controlling data transfer from RAM port to SAM port47US 5,233,564 AKabushiki Kaisha Toshiba · 1993
- Method for built-in self-testing of ring-address FIFOs45US 5,513,318 AAT&T Corp. · 1996
- Detecting faults in dual port FIFO memories39US 6,757,854 B1LSI Logic Corporation · 2004