Component die validation built-in self-test (VBIST) engine

A method of validating a component die in a multi-chip module (MCM), the method comprising:

• at a validation built-in self-test (VBIST) circuit within the component die, the VBIST circuit comprising a traffic generator that generates test data streams, a packetizer and transmit circuit that creates packets appended with cyclic redundancy check (CRC) values, a tracker that receives and validates test data streams, and a configurable switching matrix capable of providing a path for data to go from the traffic generator to the interface circuitry without going through the component circuitry or the tracker, providing a path for data to go from the traffic generator to the tracker without going through the component circuitry or the interface circuitry, providing a path for data to go from the component circuitry to the tracker without going through the interface circuitry, and providing a path for data to go from the interface circuitry to the tracker without going through the component circuitry, according to a mode of operation of the VBIST:
• configuring the configurable switching matrix to provide a first path for data to go from the traffic generator to the interface circuitry without going through the component circuitry or the tracker, a second path for data to go from the interface circuitry to the component die without going through the tracker, and a third path for data to go from the component die to the tracker;
• generating a test data stream via the traffic generator;
• sending the test data stream to a first component within the component die via the first path and the second path;
• receiving, at the tracker, a response to the test data stream via the third path;
• and
• validating the response to the test data stream.

A method of validating a component die in a multi-chip module (MCM), the method comprising:

• providing, on a component die comprising component circuitry for performing a component function and interface circuitry for communicating with a compute die not containing the component circuitry for performing the component function and that controls the component die, a validation built-in self-test (VBIST) circuit, the VBIST circuit comprising a traffic generator that generates test data streams, a packetizer and transmit circuit that creates packets appended with cyclic redundancy check (CRC) values, a tracker that receives and validates test data streams, and a configurable switching matrix capable of providing a path for data to go from the traffic generator to the interface circuitry without going through the component circuitry or the tracker, providing a path for data to go from the traffic generator to the tracker without going through the component circuitry or the interface circuitry, providing a path for data to go from the component circuitry to the tracker without going through the interface circuitry, and providing a path for data to go from the interface circuitry to the tracker without going through the component circuitry, according to a mode of operation of the VBIST;
• and
• using the VBIST circuit to validate at least one of the VBIST circuit, the component circuitry, or the interface circuitry.