G11C 29/04
Detection or location of defective memory elements
Official title: Detection or location of defective memory elements {, e.g. cell constructio details, timing of test signals}
G11C29/04 (Detection or location of defective memory elements) appears on 17,865 US grants and 16,566 published applications in this corpus.
Search patents in G11C- Granted patents
- 17,865
- Published applications
- 16,566
- Assignees
- 1,504
- Inventors
- 19,425
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 9 | 0 |
| 1977 | 7 | 0 |
| 1978 | 6 | 0 |
| 1979 | 0 | 0 |
| 1980 | 4 | 0 |
| 1981 | 6 | 0 |
| 1982 | 13 | 0 |
| 1983 | 10 | 0 |
| 1984 | 16 | 0 |
| 1985 | 15 | 0 |
| 1986 | 20 | 0 |
| 1987 | 26 | 0 |
| 1988 | 39 | 0 |
| 1989 | 52 | 0 |
| 1990 | 40 | 0 |
| 1991 | 45 | 0 |
| 1992 | 61 | 0 |
| 1993 | 79 | 0 |
| 1994 | 115 | 0 |
| 1995 | 144 | 0 |
| 1996 | 189 | 0 |
| 1997 | 191 | 0 |
| 1998 | 281 | 0 |
| 1999 | 336 | 0 |
| 2000 | 253 | 0 |
| 2001 | 288 | 118 |
| 2002 | 359 | 364 |
| 2003 | 376 | 431 |
| 2004 | 406 | 547 |
| 2005 | 385 | 578 |
| 2006 | 488 | 561 |
| 2007 | 523 | 591 |
| 2008 | 513 | 589 |
| 2009 | 454 | 571 |
| 2010 | 534 | 452 |
| 2011 | 528 | 404 |
| 2012 | 441 | 455 |
| 2013 | 504 | 478 |
| 2014 | 573 | 675 |
| 2015 | 675 | 738 |
| 2016 | 762 | 775 |
| 2017 | 783 | 705 |
| 2018 | 673 | 699 |
| 2019 | 819 | 901 |
| 2020 | 968 | 904 |
| 2021 | 904 | 927 |
| 2022 | 937 | 1092 |
| 2023 | 960 | 949 |
| 2024 | 939 | 860 |
| 2025 | 736 | 639 |
| 2026 | 380 | 563 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G11C 29/08Functional testing12,463
- G11C 29/50Marginal testing5,074
- G11C 2029/0411Online error correctionIndexing code2,719
- G11C 2029/0409Online testIndexing code2,071
- G11C 2029/0401In embedded memoriesIndexing code557
- G11C 2029/0403During or with feedback to manufactureIndexing code384
- G11C 2029/0407On power onIndexing code366
- G11C 29/06Acceleration testing297
All 9 subgroupsShow fewer
Recent patents
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- Optimization of soft bit windows based on signal and noise characteristics of memory cells8 Oct 2026US 2026/0311755 A1Micron Technology, Inc.
- Reading and Writing Device Under Test Register Values8 Oct 2026US 2026/0311789 A1National Instruments Corporation
- Semiconductor memory device with processing-in-memory using test circuitry8 Oct 2026US 2026/0311790 A1Micron Technology, Inc.
- Self-calibration in a memory device8 Oct 2026US 2026/0311791 A1Micron Technology, Inc.
Most cited
By later US patents
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- Memory management system and method627US 8,200,887 B2Violin Memory, Inc. · 2012
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- Memory management system and method590US 9,189,334 B2Violin Memory, Inc. · 2015