G11C 29/50
Marginal testing
Official title: Marginal testing, e.g. race, voltage or current testing
G11C29/50 (Marginal testing) appears on 5,074 US grants and 4,390 published applications in this corpus.
Search patents in G11C- Granted patents
- 5,074
- Published applications
- 4,390
- Assignees
- 650
- Inventors
- 7,175
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 3 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 3 | 0 |
| 1982 | 2 | 0 |
| 1983 | 5 | 0 |
| 1984 | 4 | 0 |
| 1985 | 8 | 0 |
| 1986 | 5 | 0 |
| 1987 | 6 | 0 |
| 1988 | 10 | 0 |
| 1989 | 19 | 0 |
| 1990 | 11 | 0 |
| 1991 | 9 | 0 |
| 1992 | 20 | 0 |
| 1993 | 27 | 0 |
| 1994 | 57 | 0 |
| 1995 | 45 | 0 |
| 1996 | 60 | 0 |
| 1997 | 66 | 0 |
| 1998 | 86 | 0 |
| 1999 | 125 | 0 |
| 2000 | 97 | 0 |
| 2001 | 97 | 37 |
| 2002 | 128 | 120 |
| 2003 | 132 | 134 |
| 2004 | 152 | 208 |
| 2005 | 158 | 227 |
| 2006 | 183 | 185 |
| 2007 | 181 | 213 |
| 2008 | 177 | 182 |
| 2009 | 149 | 165 |
| 2010 | 184 | 139 |
| 2011 | 139 | 115 |
| 2012 | 114 | 116 |
| 2013 | 130 | 124 |
| 2014 | 143 | 178 |
| 2015 | 179 | 170 |
| 2016 | 201 | 189 |
| 2017 | 209 | 172 |
| 2018 | 182 | 172 |
| 2019 | 200 | 188 |
| 2020 | 215 | 201 |
| 2021 | 228 | 218 |
| 2022 | 215 | 291 |
| 2023 | 219 | 272 |
| 2024 | 231 | 176 |
| 2025 | 183 | 104 |
| 2026 | 72 | 94 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Flash memory and testing method thereof15 Sep 2026US 12,738,340 B2Winbond Electronics Corp.
- Voltage monitor and off-chip driver of memory device8 Sep 2026US 12,732,187 B2Nanya Technology Corporation
- Method to calculate performance of a magnetic element comprising a ferromagnetic layer exchange-coupled to an antiferromagnetic layer25 Aug 2026US 12,716,970 B2Allegro MicroSystems, LLC
- Computing system performing duty cycle adjuster training and duty cycle adjuster training method thereof25 Aug 2026US 12,718,864 B2Samsung Electronics Co., Ltd.
- Power loss protection in memory sub-systems18 Aug 2026US 12,711,069 B2Micron Technology, Inc.
- Data preservation after a supply voltage decrease in a memory system24 Sep 2026US 2026/0290486 A1Micron Technology, Inc.
- Apparatuses and methods for identifying memory devices of a semiconductor device sharing an external resistance24 Sep 2026US 2026/0291501 A1Lodestar Licensing Group LLC
- Memory device and operating method thereof10 Sep 2026US 2026/0268961 A1Samsung Electronics Co., Ltd.
- Capacitor leak detect and retire27 Aug 2026US 2026/0251693 A1Micron Technology, Inc.
- System usage of a fast read mode for read performance20 Aug 2026US 2026/0244346 A1Micron Technology, Inc.
Most cited
By later US patents
- High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates827US 5,867,429 ASanDisk Corporation · 1999
- Soft errors handling in EEPROM devices538US 5,657,332 ASanDisk Corporation · 1997
- On-chip test circuit for evaluating an on-chip signal using an external test signal444US 6,163,862 AInternational Business Machines Corporation · 2000
- Soft errors handling in EEPROM devices433US 5,532,962 ASanDisk Corporation · 1996
- Memory system including a point-to-point linked memory subsystem431US 6,502,161 B1Rambus Inc. · 2002