G11C 2029/5006
Current
Official title: {Current}
G11C2029/5006 (Current) appears on 675 US grants and 548 published applications in this corpus.
Search patents in G11C- Granted patents
- 675
- Published applications
- 548
- Assignees
- 194
- Inventors
- 1,270
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 2 | 0 |
| 1987 | 1 | 0 |
| 1988 | 2 | 0 |
| 1989 | 4 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 2 | 0 |
| 1993 | 6 | 0 |
| 1994 | 12 | 0 |
| 1995 | 10 | 0 |
| 1996 | 14 | 0 |
| 1997 | 20 | 0 |
| 1998 | 18 | 0 |
| 1999 | 23 | 0 |
| 2000 | 15 | 0 |
| 2001 | 12 | 1 |
| 2002 | 9 | 15 |
| 2003 | 13 | 19 |
| 2004 | 30 | 33 |
| 2005 | 25 | 28 |
| 2006 | 18 | 20 |
| 2007 | 27 | 25 |
| 2008 | 24 | 29 |
| 2009 | 23 | 23 |
| 2010 | 26 | 25 |
| 2011 | 17 | 21 |
| 2012 | 17 | 21 |
| 2013 | 18 | 13 |
| 2014 | 23 | 16 |
| 2015 | 14 | 19 |
| 2016 | 20 | 22 |
| 2017 | 30 | 21 |
| 2018 | 20 | 21 |
| 2019 | 26 | 29 |
| 2020 | 31 | 24 |
| 2021 | 24 | 23 |
| 2022 | 17 | 27 |
| 2023 | 24 | 24 |
| 2024 | 25 | 26 |
| 2025 | 17 | 10 |
| 2026 | 12 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Flash memory and testing method thereof15 Sep 2026US 12,738,340 B2Winbond Electronics Corp.
- Memory sub-system incomplete shutdown debugging11 Aug 2026US 12,706,126 B2Micron Technology, Inc.
- Memory device performing leakage detection operation7 Jul 2026US 12,676,199 B2Samsung Electronics Co., Ltd.
- Adaptive write current adjustment for persistent memories2 Jun 2026US 12,646,581 B2Intel Corporation
- Method of testing a memory circuit and memory circuit19 May 2026US 12,633,368 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Capacitor leak detect and retire27 Aug 2026US 2026/0251693 A1Micron Technology, Inc.
- Apparatus including circuit usage detection mechanism and methods of manufacturing the same13 Aug 2026US 2026/0237451 A1Micron Technology, Inc.
- Method, system, device, and storage medium for determining wck-on value of lpddr chip30 Jul 2026US 2026/0221212 A1Shenzhen Rayson Technology Co., Ltd.
- Storage device, test system for sudden power-off recovery, and operating method thereof23 Jul 2026US 2026/0212948 A1Samsung Electronics Co., Ltd.
- Die and plane level failure recovery scheme2 Jul 2026US 2026/0188405 A1SanDisk Technologies LLC
Most cited
By later US patents
- Soft errors handling in EEPROM devices538US 5,657,332 ASanDisk Corporation · 1997
- Scannable sense amplifier circuit421US 5,915,084 AAdvanced Micro Devices, Inc. · 1999
- Flash EEPROM array with negative gate voltage erase operation245US 5,077,691 AAdvanced Micro Devices, Inc. · 1991
- Latent defect handling in EEPROM devices238US 5,428,621 ASunDisk Corporation · 1995
- Reference current generator, and method of programming, adjusting and/or operating same161US 6,912,150 B22005