Storage device, test system for sudden power-off recovery, and operating method thereof
AssigneeSamsung Electronics Co., Ltd.
InventorsSunghee Lee, Dae Won Kim
Life of this patent
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Abstract
A test system includes: a power supply device that supplies a power to a storage device including a plurality of nonvolatile memories; a current measurement device that measures a current consumed by the storage device; and a host device that controls the power supply device to cut off the power when the storage device is performing a target operation. The host device stores a plurality of current profiles respectively corresponding to a plurality of operations of the storage device, and identifies whether the storage device is performing the target operation, based on the current measured through the current measurement device and the plurality of current profiles.
Claims20
A test system comprising:
- a power supply device configured to supply power to a storage device comprising a plurality of nonvolatile memories;
- a current measurement device configured to measure current consumed by the storage device;
- and
- a host device configured to control, based on the storage device performing a target operation, the power supply device to cut off the power,
- wherein the host device is configured to
- store a plurality of current profiles corresponding to a plurality of operations of the storage device, respectively, and
- determine that the storage device is performing the target operation, based on (i) the current measured by the current measurement device and (ii) the plurality of current profiles.
A storage device comprising:
- a plurality of nonvolatile memories, each nonvolatile memory of the plurality of nonvolatile memories being configured to output a busy signal;
- a controller configured to control operations of the plurality of nonvolatile memories;
- and
- a multiplexer connected to busy pins of the plurality of nonvolatile memories and configured to output a busy signal of a nonvolatile memory selected from the plurality of nonvolatile memories.
An operating method of a test system, the method comprising:
- supplying power to a storage device comprising a plurality of nonvolatile memories;
- measuring current consumed by the storage device;
- determining, based on the current and a plurality of current profiles, that the storage device is performing a target operation;
- and
- cutting off power being supplied to the storage device based on determining that the storage device is performing the target operation,
- wherein the plurality of current profiles correspond to a plurality of operations of the storage device, respectively.
Dependencies are inferred from the claim text.