System usage of a fast read mode for read performance
AssigneeMicron Technology, Inc.
InventorsYu-Chung Lien, Zhenming Zhou
Life of this patent
Estimating the term…
Abstract
A system comprises a memory device and a processing device, which is coupled to the memory device. The processing device receives a read command to be performed on a set of memory cells of the memory device. The processing device determines whether a reliability metric satisfies a threshold criterion associated with the memory device. Responsive to determining that the reliability metric satisfies the threshold criterion associated with the memory device, the processing device selects a first set of trim values, wherein the first set of trim values corresponds to a latency value that is below a predefined threshold value. The processing device executes the read command with the selected set of trim values.
Claims20
A system comprising:
- a memory device;
- and
- a processing device, coupled to the memory device, wherein the processing device is configured to perform operations comprising:
- determining whether a reliability metric of a set of memory cells satisfies a threshold criterion associated with the memory device;
- responsive to determining that the reliability metric satisfies the threshold criterion associated with the memory device, selecting a first set of trim values, wherein the first set of trim values corresponds to a latency value that is below a predefined threshold value;
- and
- executing, using the selected set of trim values, a memory access operation with respect to the memory device.
A method comprising:
- determining, by a processing device, whether a reliability metric of a set of memory cells satisfies a threshold criterion associated with a memory device;
- responsive to determining that the reliability metric satisfies the threshold criterion associated with the memory device, selecting a first set of trim values, wherein the first set of trim values corresponds to a latency value that is below a predefined threshold value;
- and
- executing, using the selected set of trim values, a memory access operation with respect to the memory device.
A non-transitory computer-readable storage medium comprising executable instructions that, when executed by a processing device, cause the processing device to perform operations comprising:
- determining whether a reliability metric of a set of memory cells satisfies a threshold criterion associated with the memory device;
- responsive to determining that the reliability metric satisfies the threshold criterion associated with the memory device, selecting a first set of trim values, wherein the first set of trim values corresponds to a latency value that is below a predefined threshold value;
- and
- executing, using the selected set of trim values, a memory access operation with respect to the memory device.
Dependencies are inferred from the claim text.