G11C 2029/5004
Voltage
Official title: {Voltage}
G11C2029/5004 (Voltage) appears on 786 US grants and 615 published applications in this corpus.
Search patents in G11C- Granted patents
- 786
- Published applications
- 615
- Assignees
- 191
- Inventors
- 1,377
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 2 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 5 | 0 |
| 1993 | 3 | 0 |
| 1994 | 8 | 0 |
| 1995 | 10 | 0 |
| 1996 | 12 | 0 |
| 1997 | 16 | 0 |
| 1998 | 27 | 0 |
| 1999 | 36 | 0 |
| 2000 | 27 | 0 |
| 2001 | 26 | 9 |
| 2002 | 30 | 21 |
| 2003 | 24 | 20 |
| 2004 | 19 | 29 |
| 2005 | 18 | 32 |
| 2006 | 26 | 13 |
| 2007 | 17 | 5 |
| 2008 | 9 | 10 |
| 2009 | 10 | 10 |
| 2010 | 8 | 8 |
| 2011 | 6 | 11 |
| 2012 | 5 | 6 |
| 2013 | 6 | 5 |
| 2014 | 9 | 16 |
| 2015 | 11 | 18 |
| 2016 | 25 | 39 |
| 2017 | 42 | 41 |
| 2018 | 36 | 38 |
| 2019 | 49 | 38 |
| 2020 | 44 | 42 |
| 2021 | 48 | 43 |
| 2022 | 40 | 50 |
| 2023 | 48 | 42 |
| 2024 | 36 | 28 |
| 2025 | 25 | 15 |
| 2026 | 12 | 26 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Voltage monitor and off-chip driver of memory device8 Sep 2026US 12,732,187 B2Nanya Technology Corporation
- Methods for optimizing semiconductor device placement on a substrate for improved performance, and associated systems and methods12 May 2026US 12,626,731 B2Micron Technology, Inc.
- Random transient power test signal generator based on three-dimensional memristive discrete map21 Apr 2026US 12,607,700 B2University of Electronic Science and Technology of China
- Semiconductor chip and semiconductor system21 Apr 2026US 12,609,144 B2SK hynix Inc.
- Test devices and systems that utilize efficient test algorithms to evaluate devices under test17 Mar 2026US 12,578,362 B2Samsung Electronics Co., Ltd.
- Data preservation after a supply voltage decrease in a memory system24 Sep 2026US 2026/0290486 A1Micron Technology, Inc.
- Apparatus including circuit usage detection mechanism and methods of manufacturing the same13 Aug 2026US 2026/0237451 A1Micron Technology, Inc.
- Method, system, device, and storage medium for determining wck-on value of lpddr chip30 Jul 2026US 2026/0221212 A1Shenzhen Rayson Technology Co., Ltd.
- Data Storage Device and Method for Read Threshold Calibration in Fractional-Bit-Per-Cell Memory30 Jul 2026US 2026/0221214 A1SanDisk Technologies LLC
- Storage device, test system for sudden power-off recovery, and operating method thereof23 Jul 2026US 2026/0212948 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Soft errors handling in EEPROM devices538US 5,657,332 ASanDisk Corporation · 1997
- On-chip test circuit for evaluating an on-chip signal using an external test signal444US 6,163,862 AInternational Business Machines Corporation · 2000
- Scannable sense amplifier circuit421US 5,915,084 AAdvanced Micro Devices, Inc. · 1999
- Selective application of voltages for testing storage cells in semiconductor memory arrangements248US 5,157,629 AHitachi, Ltd. · 1992
- Efficient reduction of read disturb errors in NAND FLASH memory173US 7,818,525 B1Texas Memory Systems, Inc. · 2010