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AssigneeMicron Technology, Inc.
InventorsJames S. Rehmeyer, Christopher G. Wieduwilt
Estimating the term…
Methods of optimizing the placement of memories in a memory device including a substrate and an electrical component, and associated devices and systems, are disclosed herein. A representative method includes first testing the memories to determine at least one parameter for each of the memories indicating an ability of the memory to process signals from the electrical component. The method can further include labeling each memory with a label based on the parameter, the labels including at least a first label and a second label. The first label can indicate that the memories with the first label are better able to process signals from the electrical component than the memories with the second label. The method can further include electrically coupling the memories to the substrate such that the memories with the second label are positioned closer to the electrical component than the memories with the first label.
A memory device, comprising:
A method of optimizing the placement of memories in a memory device-module including a printed circuit board (PCB) substrate and an electrical component electrically coupled to the substrate, the method comprising:
Dependencies are inferred from the claim text.