G11C 29/06
Acceleration testing
G11C29/06 (Acceleration testing) appears on 297 US grants and 311 published applications in this corpus.
Search patents in G11C- Granted patents
- 297
- Published applications
- 311
- Assignees
- 108
- Inventors
- 669
- Latest grant
- 21 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 0 |
| 2002 | 1 | 2 |
| 2003 | 4 | 3 |
| 2004 | 1 | 3 |
| 2005 | 2 | 4 |
| 2006 | 7 | 7 |
| 2007 | 6 | 9 |
| 2008 | 4 | 6 |
| 2009 | 4 | 10 |
| 2010 | 7 | 4 |
| 2011 | 9 | 6 |
| 2012 | 3 | 17 |
| 2013 | 10 | 23 |
| 2014 | 14 | 15 |
| 2015 | 20 | 15 |
| 2016 | 30 | 25 |
| 2017 | 24 | 17 |
| 2018 | 16 | 21 |
| 2019 | 20 | 10 |
| 2020 | 13 | 19 |
| 2021 | 29 | 34 |
| 2022 | 24 | 19 |
| 2023 | 12 | 18 |
| 2024 | 18 | 13 |
| 2025 | 9 | 6 |
| 2026 | 4 | 5 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Recovery operation applying a recovery voltage via wake-up pulse for increasing a residual polarization of memory cells21 Apr 2026US 12,608,135 B2SK hynix Inc.
- Chip heat treatment system21 Apr 2026US 12,608,294 B2Kioxia Corporation
- System and method for dynamic inter-cell interference compensation in non-volatile memory storage devices3 Mar 2026US 12,567,470 B2Kioxia Corporation
- Systems and methods for reducing error log required space at low temperatures20 Jan 2026US 12,531,133 B2Intelligent Memory Limited
- Thermal conduction based batch testing system16 Dec 2025US 12,499,957 B2Micron Technology, Inc.
- System and method for dynamic inter-cell interference compensation in non-volatile memory storage devices9 Jul 2026US 2026/0196278 A1Kioxia Corporation
- Semiconductor device detecting defect in metal lines23 Apr 2026US 2026/0112441 A1SK hynix Inc.
- Motherboard for Testing Memory Modules in the Presence of Failures26 Mar 2026US 2026/0088122 A1Intelligent Memory Limited
- Chip aging method and apparatus8 Jan 2026US 2026/0011387 A1
- Two-phase cooling with assisted condensation for semiconductor devices1 Jan 2026US 2026/0006750 A1Intel Corporation
Most cited
By later US patents
- DRAM adjacent row disturb mitigation75US 9,812,185 B2Invensas Corporation · 2017
- Thin film magnetic memory device having data read current tuning function52US 6,646,911 B2Mitsubishi Denki Kabushiki Kaisha · 2003
- Method for testing semiconductor devices and an apparatus therefor52US 7,151,388 B2Kes Systems, Inc. · 2006
- Erase stress and delta erase loop count methods for various fail modes in non-volatile memory41US 9,934,872 B2SanDisk Technologies LLC · 2018
- Semiconductor storage device, nonvolatile semiconductor memory test method, and medium30US 8,539,315 B2Kabushiki Kaisha Toshiba · 2013