Method for testing semiconductor devices and an apparatus therefor
AssigneeKes Systems, Inc.
InventorsBallson Gopal, Ching Peng Teong, Samuel Syn Soo Lim
Life of this patent
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AssigneeKes Systems, Inc.
InventorsBallson Gopal, Ching Peng Teong, Samuel Syn Soo Lim
Estimating the term…
A method for testing integrated circuit devices and loading such devices into a test board for further testing and an apparatus therefor is disclosed. The method allows for selection between two modes of operation. In a first mode, the integrated circuit devices are subjected to an electrical test before being placed into the test board for further testing. In a second mode, the integrated circuit devices are tested after being placed in the test board. The apparatus allows for the selection between the first mode and the second mode. In either mode, information about the tested devices and the sockets in the test board is used to load the test boards intelligently. Intelligent loading means that devices under test (DUTs) are not placed in bad sockets and devices that do test bad are removed from the test board, with an option of replacing the failed DUT with another DUT before subsequent environmental testing of the DUTs in the test board is carried out.
An automated test handler system for integrated circuit devices comprising:
A test handler system for use with integrated circuit devices and with a plurality of test boards, each test board having a plurality of sockets, the individual ones of said plurality of sockets adapted to receive individual integrated circuit devices said test handler system comprising:
An integrated circuit test plate for performing electrical tests on an integrated circuit device comprising:
Dependencies are inferred from the claim text.