G11C 2029/0405
Comprising complete test loop
Official title: {comprising complete test loop}
G11C2029/0405 (Comprising complete test loop) appears on 153 US grants and 145 published applications in this corpus.
Search patents in G11C- Granted patents
- 153
- Published applications
- 145
- Assignees
- 91
- Inventors
- 314
- Latest grant
- 2 Dec 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 1 |
| 2002 | 2 | 2 |
| 2003 | 8 | 6 |
| 2004 | 7 | 15 |
| 2005 | 5 | 21 |
| 2006 | 12 | 19 |
| 2007 | 21 | 12 |
| 2008 | 11 | 8 |
| 2009 | 17 | 11 |
| 2010 | 11 | 6 |
| 2011 | 10 | 2 |
| 2012 | 4 | 3 |
| 2013 | 5 | 3 |
| 2014 | 2 | 8 |
| 2015 | 4 | 6 |
| 2016 | 9 | 2 |
| 2017 | 2 | 1 |
| 2018 | 2 | 2 |
| 2019 | 2 | 1 |
| 2020 | 2 | 1 |
| 2021 | 6 | 6 |
| 2022 | 1 | 1 |
| 2023 | 3 | 4 |
| 2024 | 2 | 1 |
| 2025 | 1 | 2 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Storage system and an operating method thereof2 Dec 2025US 12,487,281 B2Samsung Electronics Co., Ltd.
- Test system for memory card16 Jul 2024US 12,038,470 B2Huawei Technologies Co., Ltd.
- Method of determining defective die containing non-volatile memory cells25 Jun 2024US 12,020,762 B2Silicon Storage Technology, Inc.
- Data sampling circuit and semiconductor memory26 Dec 2023US 11,854,636 B2Changxin Memory Technologies, Inc.
- Detection circuit5 Dec 2023US 11,837,304 B2Changxin Memory Technologies, Inc.
- Fast, low area self-test for read-only memory1 Jan 2026US 2026/0004864 A1STMicroelectronics International N. V.
- Memory device and memory testing8 May 2025US 2025/0149104 A1Sigmastar Technology Ltd.
- Semiconductor device and semiconductor package20 Mar 2025US 2025/0093410 A1Samsung Electronics Co., Ltd.
- Storage system and an operating method thereof24 Oct 2024US 2024/0353486 A1Samsung Electronics Co., Ltd.
- Detection circuit5 Oct 2023US 2023/0317194 A1Changxin Memory Technologies, Inc.
Most cited
By later US patents
- Semiconductor memory device432US 5,724,366 AMitsubishi Denki Kabushiki Kaisha · 1998
- Semiconductor memory device having multi-bit testing function424US 6,816,422 B2Renesas Technology Corp. · 2004
- Redundancy analysis for embedded memories with built-in self test and built-in self repair308US 6,067,262 ALSI Logic Corporation · 2000
- Memory module, test system and method for testing one or a plurality of memory modules145US 7,231,562 B2Infineon Technologies AG · 2007
- Self-repair of embedded memory arrays103US 6,667,918 B2Mellanox Technologies, Ltd. · 2003