Test system for memory card
AssigneeHuawei Technologies Co., Ltd.
InventorsWeiwen Pang, Xiaoqiang Li
Life of this patent
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Abstract
A test system for a memory card includes a first circuit board. One side of the first circuit board is provided with a plurality of contact groups spaced apart from each other along a row direction. Another side of the first circuit board is provided with slots disposed along the row direction. The test system further includes a second circuit board. The second circuit board is provided with a test circuit, and is inserted into the slot along a direction perpendicular to the first circuit board. The second circuit board provides a test signal to the contact groups.
Claims20
A test system for a memory card, wherein the test system comprises:
- a first circuit board comprising:
- a first surface comprising a plurality of first contact groups spaced apart from each other along a row direction and forming a first row of contact groups;
- and
- a second surface comprising a first slot along the row direction, wherein the first surface and the second surface are opposite surfaces of the first circuit board;
- and
- a second circuit board comprising a test circuit and inserted into the first slot along a plane direction perpendicular to the first surface of the first circuit board,
- wherein the second circuit board inserted into the first slot on the second surface of the circuit board is configured to provide a test signal to the first row of contact groups on the first surface of the first circuit board.
Dependencies are inferred from the claim text.