G11C 29/54
Arrangements for designing test circuits
Official title: Arrangements for designing test circuits, e.g. design for test [DFT] tools
G11C29/54 (Arrangements for designing test circuits) appears on 168 US grants and 161 published applications in this corpus.
Search patents in G11C- Granted patents
- 168
- Published applications
- 161
- Assignees
- 72
- Inventors
- 420
- Latest grant
- 14 Apr 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 3 |
| 2002 | 2 | 3 |
| 2003 | 4 | 3 |
| 2004 | 3 | 0 |
| 2005 | 4 | 5 |
| 2006 | 3 | 2 |
| 2007 | 2 | 2 |
| 2008 | 3 | 4 |
| 2009 | 2 | 3 |
| 2010 | 4 | 0 |
| 2011 | 1 | 2 |
| 2012 | 1 | 0 |
| 2013 | 2 | 2 |
| 2014 | 3 | 5 |
| 2015 | 4 | 5 |
| 2016 | 6 | 7 |
| 2017 | 7 | 8 |
| 2018 | 6 | 6 |
| 2019 | 15 | 7 |
| 2020 | 10 | 20 |
| 2021 | 17 | 17 |
| 2022 | 8 | 7 |
| 2023 | 16 | 28 |
| 2024 | 20 | 11 |
| 2025 | 14 | 10 |
| 2026 | 4 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Self-repairable chip for silent data corruption issues14 Apr 2026US 12,602,298 B2Google Inc.
- Voting-based state selection for a volatile memory17 Mar 2026US 12,580,039 B2QUALCOMM Incorporated
- Sense amplifier and output latch circuit for testing10 Mar 2026US 12,573,467 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Storing memory array operational information in non-volatile subarrays10 Feb 2026US 12,547,511 B2Micron Technology, Inc.
- Signal quality optimization method and a signal quality optimization system7 Oct 2025US 12,437,802 B2Realtek Semiconductor Corp.
- Sense amplifier and output latch circuit for testing2 Jul 2026US 2026/0188416 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Systems and method to test semiconductor devices23 Oct 2025US 2025/0327849 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Self-Repairable Chip For Silent Data Corruption Issues2 Oct 2025US 2025/0307090 A1Google Inc.
- Memory device including memory chip and peripheral memory chip and method of manufacturing the memory device2 Oct 2025US 2025/0309166 A1Samsung Electronics Co., Ltd.
- Voting-based state selection for a volatile memory25 Sep 2025US 2025/0299766 A1QUALCOMM Incorporated
Most cited
By later US patents
- Method and computer program for efficient cell failure rate estimation in cell arrays118US 7,380,225 B2International Business Machines Corporation · 2008
- Semiconductor integrated circuit device having gate array and memory and input-output buffer61US 4,825,414 AFujitsu Limited · 1989
- Refresh sampling built-in self test and repair circuit61US 5,909,404 ALSI Logic Corporation · 1999
- Method of forming a database that defines an integrated circuit memory with built in test circuitry55US 5,675,545 AAmbit Design Systems, Inc. · 1997
- Testing MEM device array39US 7,026,821 B2Hewlett-Packard Development Company, L. P. · 2006