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AssigneeInternational Business Machines Corporation
InventorsRajiv V. Joshi, Rouwaida N. Kanj, Sani R. Nassif
Estimating the term…
A method and computer program for efficient cell failure rate estimation in cell arrays provides an efficient mechanism for raising the performance of memory arrays beyond present levels/yields. An initial search is performed across cell circuit parameters to determine failures with respect to a set of performance variables. For a single failure region the initial search can be a uniform sampling of the parameter space and when enough failure points have been accumulated, a mean is chosen from the mean of the detected failure points. Mixture importance sampling (MIS) is then performed to efficiently estimate the single failure region. For multiple failure regions, a particular failure region is selected by varying the memory circuit cell parameters along a random set of vectors until failures are detected, thus identifying the boundary of the failure region of interest as the closest failure region. A new mean is chosen for MIS in conformity with the location of the detected boundary.
A computer-performed method for efficiently analyzing a failure rate of a cell in an array of cells, comprising:
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