G11C 2029/5604
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Official title: {Display of error information}
G11C2029/5604 (Display of error information) appears on 87 US grants and 94 published applications in this corpus.
Search patents in G11C- Granted patents
- 87
- Published applications
- 94
- Assignees
- 63
- Inventors
- 228
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2000 | 1 | 0 |
| 2001 | 0 | 1 |
| 2002 | 2 | 4 |
| 2003 | 5 | 9 |
| 2004 | 5 | 10 |
| 2005 | 4 | 7 |
| 2006 | 8 | 7 |
| 2007 | 0 | 4 |
| 2008 | 8 | 0 |
| 2009 | 3 | 0 |
| 2010 | 3 | 5 |
| 2011 | 2 | 1 |
| 2012 | 2 | 0 |
| 2013 | 1 | 2 |
| 2014 | 1 | 3 |
| 2015 | 2 | 3 |
| 2016 | 6 | 4 |
| 2017 | 2 | 1 |
| 2018 | 2 | 1 |
| 2019 | 2 | 3 |
| 2020 | 7 | 10 |
| 2021 | 7 | 5 |
| 2022 | 1 | 3 |
| 2023 | 3 | 2 |
| 2024 | 4 | 5 |
| 2025 | 4 | 3 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for testing memory26 May 2026US 12,640,226 B2Nanya Technology Corporation
- Electronic device including DRAM and method for operating the same24 Mar 2026US 12,586,658 B2Samsung Electronics Co., Ltd.
- Glitch detection16 Dec 2025US 12,499,956 B2Micron Technology, Inc.
- Multiple sample-rate data converter19 Aug 2025US 12,395,176 B2Tektronix, Inc.
- Method and system for detecting memory error, and device12 Aug 2025US 12,387,813 B2KINGTIGER Testing Technology (SZ) Ltd.
- Glitch detection19 Mar 2026US 2026/0080961 A1Micron Technology, Inc.
- Managing memory backup power modules20 Nov 2025US 2025/0356943 A1International Business Machines Corporation
- System and method for testing memory1 May 2025US 2025/0140335 A1Nanya Technology Corporation
- Non-linear memory failure analysis method and memory test apparatus2 Jan 2025US 2025/0006286 A1UIF (University Industry Foundation), Yonsei University
- Electronic device including dram and method for operating the same12 Sep 2024US 2024/0304274 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Redundancy analysis for embedded memories with built-in self test and built-in self repair308US 6,067,262 ALSI Logic Corporation · 2000
- Method for reconfiguring a memory42US 7,076,700 B2Infineon Technologies AG · 2006
- Operating voltage tuning method for static random access memory37US 7,715,260 B1United Microelectronics Corp. · 2010
- Managing device identity24US 9,442,833 B1QUALCOMM Incorporated · 2016
- Flexible memory built-in-self-test (MBIST) method and apparatus20US 7,434,131 B22008