Method and system for detecting memory error, and device

A method for detecting a memory error, comprising:

• taking an application platform as a test engine of a memory test device, the application platform being provided with a system memory;
• capturing, by the memory test device, a data flow of an actual application program of the application platform on a memory transmission line in a manner comprising a logic analyzer;
• and
• taking, by the memory test device, a processed data flow as a memory test vector to test a tested memory device, thereby reproducing a memory error of the application platform or the application program on the memory test device, wherein
• the data flow comprises at least a command, and the command comprises at least a read command and a write command;
• when the write command on the memory transmission line is captured, the taking, by the memory test device, a processed data flow as a memory test vector to test a tested memory device comprises:
• transmitting, by the memory test device, the captured write command to a transmission line of the tested memory device according to a data writing address, a data writing sequence and a data writing time sequence of the application platform for testing;
• and recording, by the logic analyzer embedded into the memory test device, a data transmission process;
• when the read command on the memory transmission line is captured, the taking, by the memory test device, a processed data flow as a memory test vector to test a tested memory device comprises:
• transmitting, by the memory test device, the read command and a data reading address captured from the application platform to the transmission line of the tested memory device according to a captured sequence and a captured time sequence;
• receiving, by the memory test device, response data of the application platform for the read command and response data of the tested memory device for the read command;
• and
• comparing stored information in the two sets of the response data, determining that the tested memory device has an error if the stored information is inconsistent, and recording error information;
• after the capturing, by the memory test device, a data flow of an actual application program of the application platform on a memory transmission line in a manner comprising a logic analyzer, the method further comprises:
• storing, by the memory test device, the data flow in a circular buffer region;
• and
• after the taking, by the memory test device, a processed data flow as a memory test vector to test a tested memory device, the method further comprises:
• stopping, by the memory test device, updating the circular buffer region and a pointer of the circular buffer region when detecting that the tested memory device has an error, and recording a present error node and historical data of the circular buffer region.