System and method for testing memory
AssigneeNanya Technology Corporation
InventorChien Yu Chen
Life of this patent
Estimating the term…
Abstract
A system is provided. The system comprises test devices, a transport device and a data processing device. The test devices perform tests different from each other to a memory device and output test results of the tests. The transport device transports the memory device to the test devices and comprises a first storage device. The first storage device stores the test results and a list of a part of test devices that have tested the memory device. The data processing device stores fabrication data of the memory device. When the transport device determines that the memory device is defective according to at least one of the test results, the data processing device generates a report according the at least one of the test results and the fabrication data.
Claims20
A system, comprising:
- a plurality of test devices configured to perform tests different from each other to a memory device and to output test results of the tests,
- wherein in a first test of the tests, a first test device of the test devices is configured to repeatedly perform a sleep operation, a reboot operation or an idle operation with the memory device coupled to the first test device;
- a transport device that is configured to transport the memory device to the plurality of test devices and comprises:
- a first storage device configured to store the test results and a list of a part of the test devices testing the memory device;
- and
- a data processing device configured to store fabrication data of the memory device, wherein when the transport device determines that the memory device is defective according to at least one of the test results, the data processing device is further configured to generate a report according the at least one of the test results and the fabrication data.
A system, comprising:
- a first test device configured to perform read and write operations to a first memory device to perform a first test to the memory device;
- a transport device configured to place the first memory device on a test platform of the first test device,
- wherein when the first test device indicates that the first memory device fails the first test, the transport device examines a torque value of a valve holding the first memory device to determine whether the first test device functions abnormally;
- and
- a data processing device configured to store a first identity of the first memory device and fabrication data corresponding to the identity and generate a report according to the first test and the fabrication data.
A method, comprising:
- transporting memory devices between test devices through a transport device to perform tests to the memory devices;
- examining a torque value of a valve holding a first memory device of the memory devices to determine whether a first test device of the test devices functions normally through the transport device when the first test device outputs a result indicating that the first memory device fails a first test of the tests;
- determining that the first memory device is defective and output an identity of the first memory device to a data processing device when the first test device functions normally and the first memory device fails the first test;
- generating, through the data processing device, a report according to the result and wafer acceptance test data, chip probing data and final test data that correspond to the identity;
- and
- classifying the first memory device according to the report and transporting the first memory device to a bin according to the classification.
Dependencies are inferred from the claim text.