G11C 29/56016
Apparatus features
Official title: {Apparatus features}
G11C29/56016 (Apparatus features) appears on 275 US grants and 339 published applications in this corpus.
Search patents in G11C- Granted patents
- 275
- Published applications
- 339
- Assignees
- 133
- Inventors
- 732
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 2 |
| 2002 | 6 | 1 |
| 2003 | 1 | 4 |
| 2004 | 7 | 8 |
| 2005 | 3 | 9 |
| 2006 | 7 | 5 |
| 2007 | 5 | 10 |
| 2008 | 5 | 15 |
| 2009 | 14 | 12 |
| 2010 | 7 | 5 |
| 2011 | 6 | 7 |
| 2012 | 6 | 4 |
| 2013 | 2 | 9 |
| 2014 | 9 | 13 |
| 2015 | 7 | 7 |
| 2016 | 7 | 8 |
| 2017 | 8 | 11 |
| 2018 | 5 | 7 |
| 2019 | 14 | 25 |
| 2020 | 20 | 23 |
| 2021 | 27 | 28 |
| 2022 | 17 | 23 |
| 2023 | 22 | 23 |
| 2024 | 20 | 32 |
| 2025 | 24 | 24 |
| 2026 | 19 | 24 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Semiconductor device, semiconductor device testing apparatus and semiconductor device testing method6 Oct 2026US 12,755,809 B2Renesas Electronics Corporation
- Motherboard for testing memory modules in the presence of failures6 Oct 2026US 12,755,810 B2Intelligent Memory Limited
- Flash memory and testing method thereof15 Sep 2026US 12,738,340 B2Winbond Electronics Corp.
- Memory device including repair circuit and operating method thereof28 Jul 2026US 12,694,945 B2Samsung Electronics Co., Ltd.
- Technique to analyze and report accurate data, synchronizing multiple signals in a memory chip23 Jun 2026US 12,665,044 B2Tektronix, Inc.
- Memory system configured for controlling a fuse array circuit1 Oct 2026US 2026/0301834 A1SK hynix Inc.
- Method of setting signal drive strength of storage13 Aug 2026US 2026/0237453 A1Atp Electronics Taiwan Inc.
- Pec-based die read level read offset16 Jul 2026US 2026/0204332 A1Micron Technology, Inc.
- Storage controller performing odt training, method of operating the same, and method of operating storage system including the same25 Jun 2026US 2026/0179715 A1Samsung Electronics Co., Ltd.
- Test circuit and memory device including thereof, and operation method of memory device18 Jun 2026US 2026/0171185 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Testing electronic devices71US 6,392,427 B1Kaitech Engineering, Inc. · 2002
- Connector assembly for testing memory modules from the solder-side of a PC motherboard with forced hot air61US 6,357,023 B1Kingston Technology Corporation · 2002
- Method for testing semiconductor devices and an apparatus therefor52US 7,151,388 B2Kes Systems, Inc. · 2006
- Voltage and clock margin testing of memory-modules using an adapter board mounted to a PC motherboard47US 6,351,827 B1Kingston Technology Corporation · 2002
- Storage device temperature sensing38US 8,628,239 B2Teradyne, Inc. · 2014