Connector assembly for testing memory modules from the solder-side of a PC motherboard with forced hot air

A motherboard-based memory-module tester comprising:

• a motherboard having components including a processor for executing a test program and a local memory and expansion sockets for expansion cards, the components being mounted on a component side of the motherboard opposite a solder side of the motherboard;
• a plate spaced above the solder side of the motherboard;
• a standoff between the plate and the motherboard, for determining a first spacing;
• a well within an opening in the plate, the well having a second spacing to the motherboard, the second spacing being smaller than the first spacing;
• a test adaptor board, mounted to the well and electrically coupled to the local memory on the motherboard by pins;
• a test socket, mounted to the test adaptor board, for receiving a memory module for testing by the motherboard, the test socket being mounted to the test adaptor board by bolts that apply pressure between surface pads on the test socket and surface pads on the test adaptor board to make electrical contact;
• and
• a chassis for enclosing the motherboard and expansion cards for the motherboard, the chassis providing cooling air for cooling the motherboard;
• wherein the plate is mounted to the chassis while the motherboard is not directly mounted to the chassis except through the plate,
• whereby spacing for the test adaptor board to the motherboard is reduced.

A motherboard-based memory tester comprising:

• motherboard means, having a component side with components and a solder side being relatively free of components, for executing a test program on a memory module being tested;
• test socket means for receiving the memory module for testing;
• test adaptor board means, having the test socket means mounted thereon, for electrically connecting the test socket means to a memory bus means on the motherboard means;
• wherein the solder side of the motherboard means faces the test adaptor board means while the component side faces away from the test adaptor board means;
• supporting means, for supporting the test adaptor board means and the motherboard means, the supporting means having an opening to allow insertion of the memory module into the test socket means;
• spacing means, coupled between the supporting means and the motherboard means, to provide a spacing between the motherboard means and the supporting means;
• and
• spacing-reducing means, attached to the supporting means and to the test adaptor board means, for reducing a spacing from the test adaptor board means to the motherboard means, wherein the test adaptor board means has a closer spacing to the motherboard than the supporting means at the opening,
• whereby spacing from the test adaptor board means to the motherboard means is reduced.